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|  MIL-P-48189D (AR)
APPENDIX A
40.2.3 Self destruct time out. The self destruct time out
shall be tested by connecting the S.U.T. as shown in Figure 3.
Input
shall have pulses applied at a rate consistent with the
F.
overall testing time desired and the output shall be observed at
FIGURE 3.
Self destruct time out measurement.
TEST SEQUENCE:
1. Connect S.U.T. as shown in Figure 3.
2.
turn on time shall be as specified in 30.5.
3. Pulse generator shall start when
at a convenient
repetition rate. The pulse generator shall have a duty cycle of 30%
to 70%.
4. Output shall switch from a logic high (VB) to a logic low
(GND) after the following input counts:
A.
Short timeout - 32000 counts
B.
Long timeout - 392448 counts
NOTE: If time out is measured by tiem rather than counts, then
the limit shall be 0.1%.
78
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