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|  MIL-R-48577(MU)
TABLE VI - TEST EQUIPMENT LIST CON'T
ITEM NO.
DESCRIPTION
Pulse Generator
Positive square wave,
5.
Pulse width 100 msec-
triggering capability of
4.5.7.4.1. Use in
conjunction with item 3
6.
Voltmeter
D.C., O to 10v, accuracy
of 1%.
4.5 Test methods and procedures,
4.5.1 Storage temperatures.- Testing equipment utilized in this
test shall conform to the requirements of 4.4.2.3.1. The Regulator shall
be placed in the test chamber and the temperature of the chamber reduced,
over a period of 4 hours plus or minus 15 minutes, from room ambient
temperature to -80F. The Regulator shall be maintained at this extreme
temperature for a minimum of 4 hours. Upon competion of the 4 hour ex-
posure the temperature of the chamber shall be raised, over a period of
8 hours plus or minus 15 minutes, to + 160F. The regulator shall remain
at this temperature for a minimum of 4 hours. Upon completion of the 4
hour exposure the temperature of the chamber shall be reduced over a period
of 4 hours plus or minus 15 minutes to room ambient temperature. The
Regulator shall then be removed from the test chamber and subjected to
the visual and tactile examination of 4.5.6. The Regulator shall conform
to the requirements of 3.3.1. Caution shall be exercise during test to
avoid sub-jecting regulator to thermal shock.
4.5.2 Operating temperatures.- Testing equipment utilized
in this test shall conform to the requirements of 4.4.2.3.1. The Regulator
shall be placed in the test chamber and the temperature of the chamber
reduced, over a period of 4 hours plus or minus 15 minutes, from room
temperature to -40F. The Regulator shall be maintained at theis extreme
temperature for a minimum of 4 hours. At completion of the 4 hour expo-
sure, and while at -40F, the Regulator shall be subjected to the tests
in 4.5.7. Upon completion of the low temperature operability tests the
temperature of the chamber shall be raised, over a period of 8 hours plus
or minus 15 minutes, to +125F. The Regulator shall be maintained at this
extreme temperature for a minimum of 4 hours. At the completion of the
4 hour exposure, and while at +125F the Regulator shall be subjected to
the tests in 4.5.7. Upon completion of the high temperature operability
tests the temperature of the chamber shall be reduced, over a period of 4
hours plus or minus 15 minutes, to room ambient temperature. The Regula-
tor shall then be removed from the test chamber. The Regulator shall con-
form to the requirements of 3.3.2 at each temperature extreme. Caution
shall be exercised during test to avoid subjecting regulator to thermal
shock.
4.5.3 Shock.- The test equipment utilized in this test shall con-
form to the requirements of 4.4.2.3.2. The Regulator shall be shock tested
in accordance with Test Method 516.2, Procedure I with a half sine wave
shock pulse of MIL-STD-810, except conditions such as "G" values and time
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