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|  MIL-T-81148B(OS)
4.5.3.10 Resistor: 220 ohms plus or minus 1 percent, 1/2 W; MIL-R-10509
designation, RN65D2200F.
4.5.3.11 Resistor: 1000 ohms plus or minus 1 percent 1/2 W; MIL-R-10509
designation, RN65D1001F.
4.5.3.12 Resistor: 100,000 ohms plus or minus 1 percent, 1/2 W; MIL-R-
10509 designation, RN65D1003F.
4.5.3.13 Resistor: 200,000 ohms plus or minus 1 percent l12 W; MIL-R-
10509 designation, RN65D2003F.
4.5.3.14 Resistor: 240,000 ohms plus or minus 1 percent, 1/2 W; MIL-R-
10509 designation, RN65D2403F (6 required).
4.5.3.15 Resistor: 470,000 ohms plus or minus 1 percent, 1/2 W; MIL-R-
10509 designation, RN65D4703F.
4.5.3.16 Resistor: 750,000 ohms plus or minus 0.1 percent, 1/2 W; MIL-
R-10509 designation, RN65F7503B (4 required).
4.5.3.17 Resistor: 2.33 meg plus or minus 1 percent, 500 V; MIL-R-10509
designation, RN70DF2334F (two required).
4.5.3.18 Resistor: 750,000 ohms plus or minus 0.1 percent, 1/2 W; MIL-
R-10509 designation, RN65F703B.
0.22 uf plus or minus 10 percent; MIL-C-25 designa-
4.5.3.19 Capacitor:
tion, CP09A1KC224K.
4.5.3.20 Capacitor: 470 uuf plus or minus 2 percent; MIL-C-25 designation,
CP09A1KC471G (4 required).
4.5.3.21 Capacitor: 2700 uuf plus or minus 2 percent, MIL-C-5 designation,
CM20B272G (required).
4.5.3.22 Capacitor: 1000 uuf plus or minus 10 percent, 500 V, MIL-C-25
designation, CP09A1KC102K.
4.5.3.23 Semiconductor device: MIL-S-19500 JAN 1N458.
4.5.3.24 Semiconductor device: A matched set of four 1N1257 diodes, with
a forward current flow of 1 milliampere: the voltage drop across the diodes
shall be within 1.0 millivolt of each other.
4.5.4 Test procedure. The following tests constitute the quality con-
f ormance tests for the transformer.
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