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| MIL-T-81778C(AS)
(2) The signal pulse width shall be measured to an accuracy
of 0.1 usec.
s.
BIT modulation tests.
(1) The frequency shall be measured to an accuracy of
1 Hz.
(2) The noise modulation shall be measured to an accuracy of
3 percent.
(3) The amplitude shall be measured to an accuracy of 3
percent.
(4) The LPRF signal pulse width, rise and fall time, and pulse
jitter shall be measured to an accuracy of
0.01 usec
in the region of 0.05 usec.
t.
BIT target generation tests.
(1) The
target frequency shall be measured to an accuracy of
1
Hz.
(2) The
target amplitude shall be measured to an accuracy of
3
percent,
u.
BIT 3.2 megaHertz (MHz) target generation tests.
(1) The
target frequency shall be measured to an accuracy of
1
Hz.
(2) The
target amplitude shall be measured to an accuracy of
3
percent.
v. BIT horn target insertion control tests.
(1) The target amplitude shall be measured to an accuracy of
3 percent.
(2) The rise and fall time shall be measured to an accuracy of
0.01 usec.
w.
BIT reference oscillator tests,
(1) The frequency shall be measured to an accuracy of
1 Hz.
(2) The amplitude shall be measured to an accuracy of
3
percent.
x.
Logic and analog tests.
(1)
The
line driver functions shall be verified.
(2)
The
line receiver functions shall be verified.
(3)
The
standard serial interface (SSI) shall be verified.
(4)
The
analog switching shall be verified.
3.4.1.4 Receiver, Infrared R-1786( )/AWG-9.* The LFTS shall be capable of
performing the following tests on the infrared (IR) receiver:
* Tested on OJ-215( )/AWM-23(V) only.
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