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Page Title:
Table II. Sampling test sample selection |
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|  MIL-T-85396A(AS)
corrective action shall be taken to eliminate this defect from future test
sets. The 6 hour period specified above may be made up of several shorter
periods to conform to normal working hours (see 6.2.2).
4.4.5.4 Temperature tests. Temperature tests shall be performed on the
.
number of test sets specif ied in table II of electronics assembly (1098ASI3OO)
at -40 and +55 C following the manufacturing run-in tests as follows:
Soak periods shall be 1 hour at -40 or at +55 C as applicable with
a.
test set unenergized.
A dc power supply capable of supplying 200 MA, 9.9 to 14.5 volts with
b.
1 mv maximum ripple shall be substituted for the battery pack.
The battery test subsystem requirements (see 3.5.1.2.4.2) shall be
c.
verified with supply voltage at 11.25 .05 volts and at 11.60 .05
Volts .
d.
The command subsystem requirements (see 3.5.1.2.1) and detector
subsystem requirements (see 3.5.1.2.2 and 3.5.1.2.3) shall be veri-
fied with supply voltage at 11.60 .05 and at 14.25 .05 volts.
The self test subsystem (see 3.5.1.2.4) shall be verified at 11.60
e.
.05 volts.
f.
Following satisfactory conclusion of the temperature tests, the opera-
tional test shall again be performed at room ambient conditions
using battery pack 178AS200.
Sampling test sample selection
TABLE II.
4.4.6 Scope of tests. As a minimum, each test set selected for sampling
tests shall be subjected to the following:
a.
Complete operations test at ambient room conditions, making all
necessary measurements to assure that all applicable specification
requirements have been met.
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