2.3 Order of precedence. In the event of a conflict between the text of this specification and the references cited
herein the text of this document shall take precedence. Nothing in this document, however, supersedes applicable
laws and regulations unless a specific exemption has been obtained.
3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a
manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before
contract award (see 4.3 and 6.3).
3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as
specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the
QM plan shall not affect the form, fit, or function as described herein.
3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as
specified in MIL-PRF-38535 and herein.
3.3.1 Terminal connections and logic diagram. The terminal connections and logic diagram shall be as specified
on figure 1.
3.3.2 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to
the qualifying activity and the preparing activity upon request.
3.3.3 Case outlines. The case outlines shall be as specified in 1.2.3.
3.4 Lead material and finish. The lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6).
3.5 Electrical performance characteristics. The electrical performance characteristics are as specified in table I,
and unless otherwise specified, apply over the full recommended ambient operating temperature range for supply
voltages from ±5 V to ±18 V. Unless otherwise specified, the device is in the "sample" mode with CH = 0.01 µF.
With ±15 V supplies, the input voltage range is from 11.5 V to +11.5 V. The logic reference voltage is 0 V and the
logic voltage for "sample" mode is 2.5 V. Specific test conditions and limits are shown in table III.
3.5.1 Offset null circuits. The nulling inputs shall be capable of being nulled 1 mV beyond the specified offset
voltage limits for 55°C ≤ TA ≤ 125°C using the circuit of figure 2.
3.5.2 Instability oscillations. The devices shall be free of oscillations when operated in the test circuits
of this specification.
3.6 Electrical test requirements. Electrical test requirements for each device class shall be the subgroups
specified in table II. The electrical tests for each subgroup are described in table III.
3.7 Marking. Marking shall be in accordance with MIL-PRF-38535.
3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group
number 60 (see MIL-PRF-38535, appendix A).