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TABLE III. Group A inspection for device type 01.
Terminal conditions (pins not designated may be high 2.0; or low 0.7 V; or open).
MIL-
Cases E,F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Test
STD-  Cases 2,X
Subgroup  Symbol
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Measured
Limits
Unit
883
Test no.
CLR
S/R
AIN
BIN
CIN
DIN
S/L
GND
S0
S1
CLK
QD
QC
QB
QA
VCC
terminal
Min
Max
method
Serial
Serial
1
VOH
3006
1
A
GND
2.0 V
GND
GND
GND
GND
GND
4.5 V
4.5 V
A 1/
-.4 mA
4.5 V
QA
2.5
V
Tc = 25C
2
"
"
GND
2.0 V
GND
GND
"
"
"
"
"
-.4 mA
"
QB
"
"
3
"
"
"
GND
2.0 V
GND
"
"
"
"
"
-.4 mA
"
QC
"
"
4
"
"
"
"
GND
2.0 V
"
"
"
"
"
-.4 mA
"
QD
"
"
5
"
2.0 V
"
"
GND
GND
"
"
"
0.7 V
"
-.4 mA
"
QA
"
"
6
"
GND
"
"
GND
GND
2.0 V
"
0.7 V
4.5 V
"
-.4 mA
"
QD
"
"
7
"
2.0 V  2.0 V
2.0 V
2.0 V
2.0 V
2.0 V
"
4.5 V
GND
"
-.4 mA
"
QA
"
"
VOL
3007
8
"
4.5 V  0.7 V
4.5 V
4.5 V
4.5 V
4.5 V
"
"
4.5 V
"
4 mA
"
QA
0.4
"
9
"
"
4.5 V
0.7 V
4.5 V
4.5 V
"
"
"
"
"
4 mA
"
QB
"
"
10
"
"
"
4.5 V
0.7 V
4.5 V
"
"
"
"
"
4mA
"
QC
"
"
11
"
"
"
"
4.5 V
0.7 V
"
"
"
"
"
4 mA
"
QD
"
"
12
"
0.7 V
"
"
4.5 V
4.5 V
"
"
"
0.7 V
"
4 mA
"
QA
"
"
13
"
4.5 V
"
"
4.5 V
4.5 V
0.7 V
"
0.7 V
4.5 V
"
4 mA
"
QD
"
"
VIC
14
-18 mA
"
"
CLR
-1.5
"
15
-18 mA
"
"
S/R
"
"
16
-18 mA
"
"
AIN
"
"
17
-18 mA
"
"
BIN
"
"
18
-18 mA
"
"
CIN
"
"
19
-18 mA
"
"
DIN
"
"
20
-18 mA
"
"
S/L
"
"
21
"
-18 mA
"
S0
"
"
22
"
-18 mA
"
S1
"
"
23
"
-18 mA
"
CLK
"
"
Α
IIH1
3010
24
2.7 V
"
5.5 V
CLR
20
25
2.7 V
"
GND
4.5 V
"
S/R
"
"
26
2.7 V
"
"
GND
"
AIN
"
"
27
2.7 V
"
"
"
"
BIN
"
"
28
2.7 V
"
"
"
"
CIN
"
"
29
2.7 V
"
"
"
"
DIN
"
"
30
2.7 V
"
4.5 V
"
"
S/L
"
"
31
"
2.7 V
"
S0
"
"
32
"
2.7 V
"
S1
"
"
33
GND
"
2.7 V
"
CLK
"
"
IIH2
34
5.5 V
"
5.5 V
"
CLR
100
"
35
5.5 V
"
GND
4.5 V
"
S/R
"
"
36
5.5 V
"
GND
GND
"
AIN
"
"
37
5.5 V
"
"
"
"
BIN
"
"
38
5.5 V
"
"
"
"
CIN
"
"
39
5.5 V
"
:"
"
"
DIN
"
"
40
5.5 V
"
4.5 V
"
"
S/L
"
"
41
"
5.5 V
"
"
S0
"
"
42
"
5.5 V
"
S1
"
"
43
GND
"
5.5 V
"
CLK
"
"
See footnotes at end of device types 01.

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