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TABLE III. Group A inspection for device type 01 - Continued.
Terminal conditions (pins not designated may be high 2.0; or low 0.7 V; or open).
Measured
Test Limits
Unit
MIL-STD-
Cases E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
terminal
Subgroup Symbol
883
Cases 2, X *
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
method
Test no.
CLR
S/R
AIN
BIN
CIN
DIN
S/L
GND
S0
S1
CLK
QD
QC
QB
QA
VCC
Min
Max
Serial
Serial
1
IIL1
3009
44
0.4 V
GND
5.5 V
CLR
2/
2/
mA
Tc = 25C
IIL2
45
0.4 V
"
4.5 V
GND
"
S/R
"
"
"
46
0.4 V
"
"
4.5 V
"
AIN
"
"
"
47
0.4 V
"
"
"
"
BIN
"
"
"
48
0.4 V
"
"
"
"
CIN
"
"
"
49
0.4 V
"
"
"
"
DIN
"
"
"
50
0.4 V
"
GND
"
"
S/L
"
"
"
IIL3
51
"
0.4 V
"
S0
"
"
"
IIL3
52
"
0.4 V
"
S1
"
"
"
IIL4
53
4.5 V
"
0.4 V
"
CLK
"
"
"
I0S
3011
54
A
4.5 V
GND
GND
GND
"
4.5 V
4.5 V
A 1/
GND
"
QA
-15
-100
"
55
"
GND
4.5 V
GND
GND
"
"
"
"
GND
"
QB
"
"
"
56
"
"
GND
4.5 V
GND
"
"
"
"
GND
"
QC
"
"
"
57
"
"
GND
GND
4.5 V
"
"
"
"
GND
"
QD
"
"
"
ICC
3005
58
5.5 V
5.5 V
"
GND
GND
GND
5.5 V
"
5.5 V
5.5 V
"
"
VCC
23
"
Same tests, terminal conditions and limits as subgroup 1, except TC = 125C, and VIC tests are omitted.
2
Same tests, terminal conditions and limits as subgroup 1, except TC = -55C, and VIC tests are omitted.
3
See footnotes at end of device type 01.

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