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Page Title: Figure 5. Synchronous waveforms and test circuit for device type 01.
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MIL-M-38510/71D
NOTES:
1/  tf = tr 2.5 ns, t(SETUP)L = 5 ns, t(HOLD)L = 3 ns, t(SETUP)H = 5 ns, t(HOLD)H = 3 ns, PRR 1 MHz,
tD = 10 ns.
2/  When testing fMAX for subgroup 9, IN(D) PRR = 75 MHz with tD = 6 ns and for subgroups 10 and 11,
IN(D) PRR = 55 MHz with tD = 8 ns
3/  CL = 50 pF 10% including jig and probe capacitance.
4/  RL = 280 5%.
5/  All diodes are 1N3064 or equivalent.
6/  See table III for input conditions.
7/  Setup and hold time functionality may be verified by separate test from propagation delay tests, by
monitoring the output at specified setup hold conditions.
FIGURE 5. Synchronous waveforms and test circuit for device type 01.
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