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|  QUALITY CONFORMANCE INSPECTION
MIL-C-64025(AR)
CLASSIFICATION OF DEFECTS & TESTS
TITLE
NUMBER
PARAGRAPH
DRAWING
4.4.2.75
Transistor, NPN (JAN2N2369A)
11
MIL-S-19500/317
SHEET OF
NEXT HIGHER ASSEMBLY
9333746
AQL
NO. OF
SAMPLE
EXAMINATION OR TEST
OR
REQUIREMENT
PARAGRAPH REFERENCE
CATEGORY
UNITS
100%
PARAGRAPH
/lNSPECTION METHOD
None defined
Critical
Major
101
Wire material incorrect
32
Note 1
3.2
Visual
102
Wire bond
32
Note 1
3.2
Pull Tester (Note 2)
103
MIL-S-19500/317 compliance
3.2
Certification
104
Solderability (3 leads)
0.40%
3.5.1
MIL-STD-202,
Method 208
105
Leakage current ice
0.40%
3.2
MIL-STD-750,
Method 3041, Cond. B
106
Internal visual
Note 3 LTPD 10
MIL-STD-750,
Method 2072, Para 3.2
only
Minor
201
Poor workmanship
O. 65%
3.20
Visual
(1) Reject or three (3) or more defects.
(2) Pull all wire.
(3) Sampling per
MIL-M-38510,Appendix B.
--
DRSMC-QA (D) Form 160, 1 Aug 83, which may not
used.
Relaces
1570, 1
Feb
85
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