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| ![]() QUALITY
CONFORMANCE
INSPECTION
CLASSIFICATION OF DEFECTS & TESTS
MIL-C-64025(AR)
TITLE
DRAWING NUMBER
PARAGRAPH
4.4.2.76
Transistor,
(JAN2N3740), Silicon,
1
1
PNP
MIL-S-19500/441
SHEET
OF
P
Power Type
NEXT HIGHER ASSEMBLY
9333590
.
No. OF
AQL
SAMPLE
OR
REQUIREMENT
PARAGRAPH REFERENCE
EXAMINATION OR TEST
CATEGORY
100%
UNITS
PARAGRAPH
/INSPECTION METHOD
None defined
Critical
Major
101
Wire material incorrect
32
3.2
Note 1
Visual
102
Wire bond
32
Note 1
3.2
Pull Tester (Note 2)
103
MIL-S-19500/441 compliance
3.2
Certification
104
Solderability (3 leads)
0.40%
3.5.1
MIL-STD-202,
Method 208
105
Leakage current ice
3.2
0.40%
MIL-STD-750,
Method 3041, Cond. B
106
Internal visual
Note 3 LTPD 10 % 3.2
MIL-STD-750,
Method 2072, Para 3.2
only
Minor
Poor workmanship
0.65%
3.20
Visual
Reject for three (3) or more defects.
(3) Sampling per
MIL-M-3851O, Appendix B.
which may
not be used.
R e p l a c e s DRSMC-QA (D) Form 160, 1 Aug 83,
AMSMC Form 1570, 1 Feb 85
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