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MIL-E-48630(AR)
4.5.20 Integrated circuit handling procedures.  CMOS integrated
circuits require care in handling to avoid damage due to static
discharge.  The contractor shall document his handling procedure for
the CMOS integrated circuits and supply the procedure to the
Government (see 6.6).  Adherence to the handling procedure shall be
(Ref. DI-T-5372 (Tailored)).
verified daily.
4.5.21 Data requirements.  The contractor shall submit a
quality inspection test, demonstration and evaluation report in
accordance with Data Item Description DI-R-1724.  It shall include
all detailed inspection and test results.  Test data reports shall
be submitted to the technical agency listed in 6.4.
4.5.22 Quality assurance soldering plan.  The QA soldering plan
as noted in 3.5.5.2 shall be submitted for Government approval (see
(Ref. DI-T-5372 (Tailored)).
6.6).
4.5.23 Variables data.  The contractor shall submit variables
data in accordance with Data Item Description DI-R-1724 for the
First Article samples and surveillance units.  It shall include all
detailed inspection and test results with respect to the following
parameters:  Primary Time Base Oscillator Period, Test Time Base
Oscillator Period, Quiescent Current, Low Voltage Detection Level,
Magnetic Sensor Threshold Level.  Test data reports shall be
submitted to the technical agency listed in 6.4.
4.5.24
4.5.25 Ballistic test.  Electronic assemblies shall be capable
of performance as stated herein after being subjected to the
ballistic environment of the 155MM M109A1 Howitzer, zone 8 and
conditioned at 145F.  The electronic assemblies shall be
forwarded to the load plant specified in the contract for assembly
into non-hazardous test projectiles.  Electronic assemblies, P/N
9342551-1 & -2, shall be loaded into Projectile, 155MM test,
Non-hazardous, M718 type, Dwg. 9317597.  Electronic assemblies, P/N
9342552-1 & -2, shall be loaded into Projectile, 155MM test,
Non-hazardous, M741 type, Dwg. 9317598.  Testing of the projectile
and mines shall be in accordance with MIL-P-63238, para. 4.5.8 as
applicable for the Non-hazardous type mines.  Of the forty-five (45)
mines of each type to be tested, nine (9) shall be randomly chosen
and allowed to self-destruct per MIL-P-63238, para. 4.5.8.3.b. (1}.
The remaining thirty-six (36) shall be tested for sensor performance
per MIL-P-63238, para. 4.5.8.3.b. (2).
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