Modules, Standard Electronic, Controller, Microprocessor, Key Code RRA

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Modules, Standard Electronic, Controller, Microprocessor, Key Code RRA

Modules, Standard Electronic, Controller, Microprocessor, Key Code RRA
Module Configuration Requirements
Figure 1. RRA module function diagram, microprocessor controller
Table I. Module electrical requirements
Table I. Module electrical requirements (cont)
Table I. Module electrical requirements (cont)
Alternate Test Methods
Input to Output Relationship
Table II. Input to Output Relationship (status word chart)
Figure 2. Operating temperature and life test circuit
Figure 3. Component temperature test circuit
Figure 4. Vibration test circuit
Table III. Isolation test
Figure 5. Isolation test circuit for table III
Table IV. Vcc stress test
Figure 6. Vcc stress test circuit for table IV
Table V. Output short circuit current test
Figure 7. Output short circuit current test circuit for table V
Figure 8. Output short circuit current test circuit waveforms for table V
Table VI. Input clamp diode voltage test
Figure 9. Input clamp diode voltage test circuit for table VI
Table VII. High impedance leakage current (high-level) test
Figure 10. High impedance leakage current (high-level) test circuit for table VII
Table VIII. High impedance leakage current (low-level) test
Figure 11. High impedance leakage current (low-level) test circuit for table VIII
Table IX. Output voltage (high-level) test
Table X. Output voltage (low-level) test
Figure 12. Output voltage (high-level and low-level) test circuit for tables IX and X
Figure 13. Output voltage (high-level and low-level) test circuit waveform for tables IX and X
Figure 14. RRA logic load circuit
Table XI. Input current (high-level) test
Table XI. Input current (high-level) test (cont)
Figure 15. Input current (high-level) test circuit for table XI
Table XII. Input current (low-level) test
Figure 16. Input current (low-level) test circuit for table XII
Table XIII. Power supply current test
Figure 17. Power supply current test circuit for table XIII
Table XIV. Functional test
Table XIV. Functional test (cont)
Table XIV. Functional test (cont)
Table XIV. Functional test (cont)
Table XIV. Functional test (cont)
Table XIV. Functional test (cont)
Figure 18. Functional test circuit for table XIV
Table XV. Enable delay time (tPZH and tPZL) and propagation delay time (tPHL and tPLH) test
Table XV. Enable delay time (tPZH and tPZL) and propagation delay time (tPHL and tPLH) test (cont)
Table XV. Enable delay time (tPZH and tPZL) and propagation delay time (tPHL and tPLH) test (cont)
Table XV. Enable delay time (tPZH and tPZL) and propagation delay time (tPHL and tPLH) test (cont)
Table XV. Enable delay time (tPZH and tPZL) and propagation delay time (tPHL and tPLH) test (cont)
Table XV. Enable delay time (tPZH and tPZL) and propagation delay time (tPHL and tPLH) test (cont)
Figure 19. Enable delay time (tPZH and tPZL) and propagation delay time (tPHL and tPLH) test waveforms
Table XVI. Crosstalk (low-level) test
Table XVI. Crosstalk (low-level) test (cont)
Table XVII. Crosstalk (high-level) test
Table XVII. Crosstalk (high-level) test (cont)
Figure 20. Crosstalk (low-level and high-level) test circuit for tables XVI and XVII
Figure 21. Crosstalk (low-level and high-level) test circuit waveforms for tables XVI and XVII
Figure 22. Crosstalk (low-level and high-level) test circuit waveforms for tables XVI and XVII
Table XVIII. Power supply transient amplitude test
Table XX. Input capacitance test
Figure 23. Power supply transient amplitude test circuit for table XVIII
Figure 24. Power supply transient amplitude test circuit waveforms for table XVIII
Figure 25. Power supply filter capacitance, input capacitance, and output capacitance test circuit
Table XXII. Input/output capacitance test
Figure 26. Input/output capacitance test circuit for table XXII
Table XXIII. Setup and hold time test
Figure 27. Setup and hold time test circuit for table XXIII
Figure 28. Setup and hold time test circuit waveforms for table XXIII
Figure 29. Setup and hold time test circuit waveforms for table XXIII
Figure 30. Setup and hold time test circuit waveforms for table XXIII
Figure 31. Setup and hold time test circuit waveforms for table XXIII
Table XXIV. Setup and hold time test
Table XXIV. Setup and hold time test (cont)
Figure 32. Setup and hold time test circuit for table XXIV
Figure 33. Setup and hold time test circuit waveforms for table XXIV
Figure 34. Setup and hold time test circuit waveforms for table XXIV
Standradization Document Improvement Proposal
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Modules, Standard Electronic, Controller, Microprocessor, Key Code RRA

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