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Figure 5. Transient response test circuit alternate device type 07 |
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|  MIL-M-38510/101H
(Alternate) device type 07
NOTES:
1. K1 is closed for small tests (Tr and P.O.) and is open for large signal tests ( slew rate, Ts).
2. Input signal is a -50 mV to 0 mV pulse train for small signal tests and -5 V to +5 V pulse train for large
signal tests.
3. Tr of the input signal is < 10 ns for the small signal tests.
FIGURE 5. Transient response test circuit - Continued.
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