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Page Title:
Figure 9. Accelerated burn-in and life test circuit (or equivalent). |
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|  MIL-M-38510/101H
NOTES:
If accelerated, high temperature test conditions are used, the device manufacturer shall ensure that at least 85 percent
of the applied voltage is dropped across the device during test at temperature. The device is not considered
functional under accelerated test conditions. For dual devices both halves are connected as above. The actual
measured value of the resistor selected shall not exceed 5 percent of its branded value due to use, heat, or age.
FIGURE 9. Accelerated burn-in and life test circuit (or equivalent).
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