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Page Title:
Quality conformance inspection. |
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|  MIL-M-38510/101H
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-M-38510. Inspections to be
performed shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, and D inspections (see
4.4.1 through 4.4.4).
4.4 Quality conformance inspection. Quality conformance inspection shall be in accordance with MIL-M-38510 and as
specified herein. Inspections to be performed shall be those specified in method 5005 of MIL-STD-883, and herein for groups
A, B, C, and inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection. Group A inspection shall be in accordance with table I of method 5005 of MIL-STD-883 and as
follows:
a.
Subgroups 9, 10, and 11 shall be omitted.
b.
Tests shall be as specified in table II herein.
c.
Subgroups 12 and 13 (for device type 07 only) shall be added to table I of method 5005 of MIL-STD-883
for class S only. The class S sample size series for subgroup 12 shall be 5 and for subgroup 13 the class S sample
size series shall be 7.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of method 5005 of MIL-STD-883 and as
follows:
a.
Electrical parameters shall be as specified in table II herein.
b.
Steady state life test for class S devices shall be in accordance with table IIa of method 5005 of MIL-STD-883,
using the circuit shown on figure 9. If alternate burn-in conditions are used, the circuit shown on either figure 7
or figure 8 shall be used.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table III, method 5005 of MIL-STD-883 and as
follows:
a.
End point electrical parameters shall be as specified in table II herein. Delta limits shall apply only to subgroup 1
of group C inspection for class B devices.
b.
Life test for class B (method 1005 of MIL-STD-883). Test condition D using the circuit shown on figure 7 or
test condition C using the circuit shown on figure 8, or test condition F using the circuit shown on figure 9.
c.
Subgroups 3, 4, and 5 shall be added to group C inspection and shall consist of subgroups 8, 12, and 13 respectively
as specified in table III herein. The sample size series for subgroup 12 shall be 5, and subgroup 13 shall be 7 for
class B devices (see MIL-PRF-38535, Appendix D).
4.4.4 Group D inspection. Group D inspection shall be in accordance with table IV of method 5005 of MIL-STD-883. End
point electrical parameters shall be as specified in table II herein.
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