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Page Title:
Table 3. Group A inspection for device type 01-cont. |
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|  TABLE III. Group A inspection for device type 01 - Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open)
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Cases
Limits
A,C,D
-
3
4
5
6
7
8
-
9
10
11
12
1
2
Measured
Note
Subgroup
Symbol
Case
terminal
Min
Max
Unit
M
NC
BQ2
EQ2
CQ2
BQ1
EQ1
CQ1
NC
BQ3
SUB
CQ3
CQ4
EQ4
BQ4/
Test no.
EQ3
3
GND
CQ4
3 V/
GND
IB
BQ3
2500
10
hFE(D)
133
TA = -55C
1 mA
"
CQ4
3 V/
GND
IB
BQ3
1500
11
hFE(D)
134
100 A
GND
3 V/
"
4
BQ1
60
12
hFE
135
Ib
TA = 25C
1 mA
GND
3 V/
"
BQ2
60
13
hFE
136
Ib
1 mA
137
CQ1
300
MHz
14
ft
138
CQ2
"
"
14
ft
139
CQ3
"
"
14
ft
140
CQ4
"
"
14
ft
GND
3 V/
GND
5
BQ1
60
12
141
Ib
hfe
1 mA
TA =
+125C
GND
3 V/
"
BQ2
60
13
142
Ib
hfe
1 mA
GND
3 V/
"
6
BQ1
35
12
143
Ib
hfe
TA = -55C
1 mA
GND
3 V/
"
144
BQ2
35
13
Ib
hfe
1 mA
NOTES:
13. hfe = 0.1 mA/ĆIb
10. hFE(D) = 1 mA/IBQ3
11. hFE(D) = 100 A/IBQ3
14. f = 100 MHz, measure hfe,
ft = 100 hfe (see figure 4)
12. Adjust Ib until IC = 1.1 mA
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