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Page Title:
Figure 4. Waveforms for propagation delay time and test circuit for device type 01-cont. |
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|  MIL-M-38510/11D
SUM MODE TEST TABLE
FUNCTION INPUTS: S0 = S3 = 4.5 V, S1 = S2 = M = 0 V
INPUT
OTHER INPUT SAME BIT
OTHER DATA INPUTS
OUTPUT
UNDER
UNDER
TEST
OUTPUT
APPLY
APPLY
APPLY
APPLY
TEST
TEST
WAVEFORM
4.5 V
GND
4.5 V
GND
None
Remaining
Cn
1
tPLH1
1/
Any F I
A
BI
I
tPHL1
A and B
None
Remaining
Cn
1
tPLH1
Any F I
BI
A
I
tPHL1
A and B
tPLH3
None
None
Remaining
1
A
BI
P
I
tPHL3
A and B , Cn
None
None
Remaining
1
tPLH3
BI
A
P
I
tPHL3
A and B , Cn
1
None
Remaining
Remaining
tPLH5
A
BI
G
I
tPHL5
A , Cn
B
None
Remaining
Remaining
1
tPLH5
G
BI
A
I
tPHL5
A , Cn
B
1
tPLH7
Cn
None
None
All B
Any F I
All A
tPHL7
Cn+4
1
tPLH9
Cn
None
None
All B
All A
tPHL9
None
Remaining
Remaining
Cn+4
2
tPLH11
A
BI
I
tPHL11
A , Cn
B
None
Remaining
Remaining
Cn+4
2
tPLH11
BI
A
I
tPHL11
A , Cn
B
1/ In A I, B I, and F I, I = 0, 1, 2, or 3.
FIGURE 4. Waveforms for propagation delay time and test circuit for device type 01 - Continued.
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