 |
|||
|
Page Title:
Table 3. Group A inspection for all device types-cont. |
|
||
| ||||||||||
|
|  TABLE III. Group A inspection for all device types Continued.
Applied voltages
Applied digital
DUT digital
Active
Measurement
Limits
Units
ref. pin 9
code-word
output
relays
sense lines
Equation and notes
(figures 6, 8)
code-word
ref. pin 9
Subgroup Symbol Test
Min
Max
29 <-------------> 40
29 <-------------> 16
7
11
1
Pin
Value
Unit
no.
VEE
VDD
VCC
MSB <------------> LSB
MSB <------------> LSB
(V)
(V)
(V)
7
For end-point linearity error,
LE(N) = (E(N+754)+E(N+755)) / 2-V(ideal)) / S
V(ideal) = N1* S+E755-S/2
TA =
+25C
N1 = Applied ref DAC code-word
S = (E754-E755) / 4094
1111 1111 111φ
577
+15.0
-15.0
+5.0
1111 1111 1110
KA
13
E754
V
0000 0000 000φ
578
"
"
"
0000 0000 0000
"
"
E755
"
Determine the code-word and the value of the maximum positive Linearity Error for all combinations of the digital input code words from (0000 0000 0000) to
(1111 1111 1111).
<-----(N1-1)----->
<-----(N-1)----->
579
+15.0
-15.0
+5.0
0
+0.5
LSB
KA
13
E756
V
LEmp
LEmp = (E756+E757) / 2-N1*S-E755+S / 2) / S
<-----(N-1)----->
<-----(N)----->
"
"
"
"
E757
"
All device types
Determine the code-word and the value of the maximum negative Linearity Error for all combinations of the digital input code words from (0000 0000 0000) to
(1111 1111 1111).
<-----(N1-1)----->
<-----(N-1)----->
580
+15.0
-15.0
+5.0
-0.5
0
LSB
KA
13
E758
V
LEmn
LEmn = (E758+E759) / 2-N1*S-E755+S / 2) / S
<-----(N-1)----->
<-----(N)----->
"
"
"
"
E759
"
All device types
For Linearity Error, the worst positive and negative error values, as determined by the manufacturer's abbreviated Integral Linearity Error (LE) test procedure for subgroup 4 shall be within 150 milliLSB of the
worst positive and negative error values, as determined by the all codes test.
|
|
Privacy Statement - Press Release - Copyright Information. - Contact Us |
Click
here for thousands of PDF manuals