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Page Title:
Table 3. Group A inspection for all device types-cont. |
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|  TABLE III. Group A inspection for all device types Continued.
Applied voltages
Applied digital
DUT digital
Active
Measurement
Limits
Units
ref. pin 9
code-word
output
relays
sense lines
Equations and notes
(figures 6, 8)
code-word
ref. pin 9
Subgroup Symbol Test
Min
Max
29 <-------------> 40
29 <-------------> 16
7
11
1
Pin
Value
Unit
no.
VEE
VDD
VCC
MSB <------------> LSB
MSB <------------> LSB
(V)
(V)
(V)
8
For end-point linearity error,
LE(N) = (E(N+766)+E(N+767)) / 2-V(ideal)) / S
V(ideal) = N1* S+E767-S/2
TA =
-55C
N1 = Applied ref DAC code-word
S = (E760-E761) / 4094
1111 1111 111φ
585
+15.0
-15.0
+5.0
1111 1111 1110
KA
13
E766
V
0000 0000 000φ
586
"
"
"
0000 0000 0000
"
"
E767
"
Determine the code-word and the value of the maximum positive Linearity Error for all combinations of the digital input code words from (0000 0000 0000) to
(1111 1111 1111).
<-----(N1-1)----->
<-----(N-1)----->
587
+15.0
-15.0
+5.0
0
+1.0
LSB
KA
13
E768
V
LEmp
LEmp = (E768+E769) / 2-N1*S-E767+S / 2) / S
<-----(N)----->
<-----(N-1)----->
"
"
"
"
"
E769
"
All device types
Determine the code-word and the value of the maximum negative Linearity Error for all combinations of the digital input code words from (0000 0000 0000) to
(1111 1111 1111).
<-----(N1-1)----->
<-----(N-1)----->
588
+15.0
-15.0
+5.0
-1.0
0
LSB
KA
13
E770
V
LEmn
LEmn = (E770+E771) / 2-N1*S-E767+S / 2) / S
<-----(N)----->
<-----(N-1)----->
"
"
"
"
"
E771
"
All device types
For Linearity Error, the worst positive and negative error values, as determined by the manufacturer's abbreviated Integral Linearity Error (LE) test procedure for subgroup 4 shall be within 150 milliLSB of the
worst positive and negative error values, as determined by the all codes test.
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