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| TABLE III. Group A inspection for device type 02.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
Test limits
Case A,B,C,D
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Meas.
Subgroup
Symbol
MIL-
CLOCK
CLOCK
terminal
STD-883
Test No.
1D
2D
VCC
3D
4D
NC
4Q
3Q
NC
GND
2Q
1Q
Min
Max
Unit
3-4
1-2
method
10
3003
70
IN-W
5.0 V
GND
A
OUT
1D-1Q
2
44
ns
tPLH1
"
Fig 4-A
71
IN-W
"
"
A
OUT
2D-2Q
"
"
"
TC = 125C
"
"
72
A
"
IN-W
OUT
"
3D-3Q
"
"
"
"
"
73
A
"
IN-W
OUT
"
4D-4Q
"
"
"
3003
74
IN-X
"
"
A
OUT
1D-1Q
"
38
"
tPHL1
"
Fig 4-B
75
IN-X
"
"
A
OUT
2D-2Q
"
"
"
"
"
76
A
"
IN-X
OUT
"
3D-3Q
"
"
"
"
"
77
A
"
IN-X
OUT
"
4D-4Q
"
"
"
3003
78
IN
"
"
IN
OUT
CLK 1-2-1Q
"
44
"
tPLH3
"
Fig 5
79
IN
"
"
IN
OUT
CLK 1-2-2Q
"
"
"
"
"
80
IN
"
IN
OUT
"
CLK 3-4-3Q
"
"
"
"
"
81
IN
"
IN
OUT
"
CLK 3-4-4Q
"
"
"
"
82
IN
"
"
IN
OUT
CLK 1-2-1Q
"
25
"
tPHL3
"
"
83
IN
"
"
IN
OUT
CLK 1-2-2Q
"
"
"
"
"
84
IN
"
IN
OUT
"
CLK 3-4-3Q
"
"
"
"
"
85
IN
"
IN
OUT
"
CLK 3-4-4Q
"
"
"
11
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C.
NOTES:
A = Clock pulse A, see figure 4.
W and X = Various D-input pulses, see figure 4.
1/ Latch voltage, VLT, shall be measured no sooner than 10 s after switching transition occurs.
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