Truth tables and logic equations

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Truth tables and logic equations

Truth tables and logic equations
Quality conformance inspection
Table 1. Electrical performance characteristics
Table 1. Electrical performance characteristics-cont.
Table 2. Electrical test requirements
Figure 1. Terminal connections
Figure 2. Logic diagrams
Figure 3. Truth tables
Figure 4. Static burn-in test circuit
Figure 5. Dynamic burn-in and steady-state life test circuits
Figure 6. Switching time test circuit and waveforms
Figure 6. Switching time test circuit and waveforms Device type 02
Figure 6. Switching time test circuit and waveforms Device type 03
Figure 6. Switching time test circuit and waveforms Device type 04
Figure 6. Switching time test circuit and waveforms Device type 03
Figure 6. Switching time test circuit and waveforms Device type 04
Table 3. Group A inspection for device type 01
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 01-cont.
Table 3. Group A inspection for device type 02
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 02-cont.
Table 3. Group A inspection for device type 03
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 03-cont.
Table 3. Group A inspection for device type 04
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 04-cont.
Table 3. Group A inspection for device type 04-cont.
Burn-in and life test cool down procedures
Figure 7. High voltage (Vzap) test circuit
Data reporting
Figure 8. Threshold voltage test circuit
Logistic support
Handling
Instructions
Standardization Document Improvement Proposal

Truth tables and logic equations

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