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|  MIL-M-38510/203E
TABLE II. Electrical test requirements.
Subgroups (see table III)
1/, 2/, 3/
MIL-PRF-38535
Class S
Class B
test requirements
devices
devices
Interim electrical parameters
1
1
Final electrical test parameters
1*, 2, 3, 7*,
1*, 2, 3,
for unprogrammed devices
8
7*, 8
Final electrical test parameters
1*, 2, 3, 7*
1*, 2, 3, 7*,
for programmed devices
8, 9, 10, 11
8, 9
Group A test requirements
1, 2, 3, 7, 8,
1, 2, 3, 7, 8
9, 10, 11
9, 10, 11
Group B end-point electrical parameters
1, 2, 3, 7, 8,
N/A
when using the method 5005 QCI option
9, 10, 11
Group C end-point electrical
1, 2, 3, 7, 8,
1, 2, 3, 7, 8
parameters
9, 10, 11
Group D test requirements
1, 2, 3, 7, 8
1, 2, 3, 7, 8
1/ * indicates PDA applies to subgroups 1 and 7.
2/ Any or all subgroups may be combined when using high-speed testers.
3/ Subgroups 7 and 8 shall consist of verifying the pattern specified.
Processing options. Since the PROM is an unprogrammed memory capable of being programmed by either the
3.8
manufacturer or the user to result in a wide variety of PROM configurations, two processing options are provided for
selection in the contract, using an altered item drawing.
3.8.1 Unprogrammed PROM delivered to the user. All testing shall be verified through group A testing as defined in
3.3.2.1, table II, and table III. It is recommended that users perform subgroups 7 and 9 after programming to verify the
specific program configuration.
3.8.2 Manufacturer-programmed PROM delivered to the user. All testing requirements and quality assurance
provisions herein, including the requirements of the altered item drawing, shall be satisfied by the manufacturer prior to
delivery.
3.9
Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number
14 (see Appendix A MIL-PRF-38535.)
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