Microcircuits, Digital, 32,768 BIT Schottky, Bipolar, Programmable Read-only Memory (PROM), Monolithic Silicon

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Microcircuits, Digital, 32,768 BIT Schottky, Bipolar, Programmable Read-only Memory (PROM), Monolithic Silicon

Microcircuits, Digital, 32,768 BIT Schottky, Bipolar, Programmable Read-only Memory (PROM), Monolithic Silicon
Truth table
Unprogrammed PROM delivered to the user
Table 1. Electrical performance characteristics
Table 2. Electrical test requirements
Qualification inspection
Programming procedure identification
Figure 1. Terminal connections
Figure 2. Truth table (unprogrammed)
Figure 3. Functional block diagrams
Figure 3. Functional block diagrams Circuit B
Figure 3. Functional block diagrams Circuit C
Figure 3. Functional block diagrams Circuit F
Figure 4. Burn-in and life test circuit
Figure 5. Switching time waveforms
Figure 5. Switching time waveforms output disable time
Table 3. Group A inspection for device type 01 and 02
Table 3. Group A inspection for device type 01 and 02-cont.
Table 3. Group A inspection for device type 01 and 02-cont.
Table 3. Group A inspection for device type 01 and 02-cont.
Programming procedure A
Table 4A. Programming procedure A characteristics
Table 4B. Programming procedure B characteristics
Programming procedure C
Table 4C. Programming procedure C characteristics
Programming procedure F
Table 4D. Programming procedure F characteristics
Figure 6A. Programming voltage waveforms during programming procedure A
Figure 6B. Programming voltage waveforms during programming procedure B
Figure 6C. Programming voltage waveforms during programming procedure C
Figure 6D. Programming voltage waveforms during programming procedure F
Figure 7. Freeze-out test bias configuration
Figure 8. Load circuit
Ordering data
Timing parameter abbreviations
Timing limits
Logistic support
Instructions
Standardization Document Improvement Proposal

Microcircuits, Digital, 32,768 BIT Schottky, Bipolar, Programmable Read-only Memory (PROM), Monolithic Silicon

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