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Page Title:
Table 3. Group A inspection for device type 05-cont. |
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|  TABLE III. Group A inspection for device type 05 Continued. 1/
MIL-
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Subgroup
Symbol
STD-
A,B,D
Test limits
Measured
Unit
883
terminal
Case C
3
2
1
14
13
12
11
10
9
8
7
6
5
4
Min
Max
method
Test no.
Q2
Q1
Clock 1
D1
Clear 1
VCC
Clear 2
D2
Clock 2 Preset 2
Q2
GND
Q1
Preset 1
9
tPLH
3003 86 CKT A
IN
IN(G)
B
5.0 V
GND
OUT
5.0 V
Clock1/Q1
10
100
ns
TC=+25C
(Fig. 11) 86 CKT B
IN
IN(G)
B
"
"
OUT
5.0 V
Clock1/Q1
"
72
"
87 CKT A
"
B
IN(G)
IN
5.0 V
OUT
"
Clock2/Q2
"
100
"
87 CKT B
"
B
IN(G)
IN
5.0 V
OUT
"
Clock2/Q2
"
72
"
88 CKT A
IN
IN(H)
B
"
"
OUT
5.0 V
Clock1/Q1
"
150
"
tPHL
88 CKT B
IN
IN(H)
B
"
"
OUT
5.0 V
"
110
"
Clock1/Q1
89 CKT A
"
B
IN(H)
IN
5.0 V
OUT
"
Clock2/Q2
"
150
"
89 CKT B
"
B
IN(H)
IN
5.0 V
OUT
"
Clock2/Q2
"
110
"
"
100
"
tPLH
3003 90 CKT A
IN
IN(G)
5.0 V
"
"
OUT
B
Clock1/Q1
"
72
"
Clock1/Q1
(Fig. 12) 90 CKT B
IN
IN(G)
5.0 V
"
"
OUT
B
Clock2/Q2
"
100
"
91 CKT A
"
5.0 V
IN(G)
IN
B
OUT
"
Clock2/Q2
"
72
"
91 CKT B
"
5.0 V
IN(G)
IN
B
OUT
"
tPHL
92 CKT A
IN
IN(H)
5.0 V
"
"
OUT
B
Clock1/Q1
"
150
"
92 CKT B
IN
IN(H)
5.0 V
"
"
OUT
B
Clock1/Q1
"
110
"
93 CKT A
"
5.0 V
IN(H)
IN
B
OUT
"
Clock2/Q2
"
150
"
93 CKT B
"
5.0 V
IN(H)
IN
B
OUT
"
Clock2/Q2
"
110
"
10
fMAX 5/ (Fig. 11)
94
IN
IN(H)
5.0 V
"
"
OUT
B
Clock1/Q1
2.5
MHz
TC=+125C
95
IN
IN(G)
5.0 V
"
"
OUT
B
Clock1/Q1
"
"
96
"
5.0 V
IN(H)
IN
B
OUT
"
Clock2/Q2
"
"
97
"
5.0 V
IN(G)
IN
B
OUT
"
Clock2/Q2
"
"
tPLH
3003 98 CKT A
IN
"
"
OUT
J
Clear1/Q1
10
125
ns
(Fig. 10) 98 CKT B
IN
"
"
OUT
J
Clear1/Q1
"
"
85
99 CKT A
J
"
"
OUT
IN
Preset 1/Q1
"
"
125
Preset 1/Q1
99 CKT B
J
"
"
OUT
IN
85
"
"
Clear2/Q2
100 CKT A
"
IN
J
OUT
"
"
"
125
100 CKT B
"
IN
J
OUT
"
"
Clear2/Q2
"
85
101 CKT A
"
J
IN
OUT
"
125
"
Preset 2/Q2
"
101 CKT B
"
J
IN
OUT
"
"
85
"
Preset 2/Q2
See footnotes at end of device type 05.
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