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Page Title:
Table 3. Group A inspection for device types 16-cont. |
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|  TABLE III. Group A inspection for device type 15 - Continued
Terminal conditions (pins not designated may be high ≥2.1 V or low ≤0.8 V, or open or GND)
Subgroup
Symbol
MIL-STD-
Case W
1
2
3
4
5
6
7
8
9
10
11
Test limits
883
Meas.
Case X and K
1
2
3
4
5
6
7
8
9
10
11
method
terminal
Case Y
1
2
3
4
5
7
8
9
10
11
12
Test No.
A3
A2
A1
A0
A5
A6
A7
GND
D1
Q1
D2
Min
Max
Unit
A
1
IOLZ
53
GND
0.4 V
0.45 V
Q1
-50
50
TC = 25C
54
"
0.4 V
Q2
"
"
"
55
"
Q3
"
"
"
56
"
Q4
"
"
"
VOL
3007
57
"
0.8 V
8 mA
Q1
.45
V
58
"
0.8 V
Q2
"
"
59
"
Q3
"
"
60
"
Q4
"
"
VOH
3006
61
"
2.1 V
-5.2 V
Q1
2.4
"
62
"
2.1 V
Q2
"
"
63
"
Q3
"
"
64
"
Q4
"
"
IOS
65
GND
GND
GND
GND
GND
GND
GND
"
5.5 V
GND
Q1
-10
-70
mA
66
"
"
"
"
"
"
"
"
5.5 V
Q2
"
"
"
67
"
"
"
"
"
"
"
"
Q3
"
"
"
68
"
"
"
"
"
"
"
"
Q4
"
"
"
ICC
3005
69
GND
GND
GND
GND
GND
GND
GND
GND
GND
GND
VCC
1/
2
Same tests, terminal conditions, and limits as subgroup 1, except TC = 125C.
3
Same tests, terminal conditions, and limits as subgroup 1, except TC = -55C and ICC (max) limit = 90 mA.
7
Functional
3014
70
3/
3/
3/
3/
3/
3/
3/
GND
3/
3/
3/
Q
TC = 25C
tests
8
Same tests, terminal conditions, and limits as subgroup 7, except TC = -55C and ICC (max) limit = 90 mA.
9
Fig. 5
71
4/
4/
4/
4/
4/
4/
4/
GND
4/
5/
4/
Q
55
ns
tAVQV
TC = 25C
tSVQV
72
"
"
"
"
"
"
"
"
"
"
"
"
40
"
tSCQZ
73
"
"
"
"
"
"
"
"
"
"
"
"
40
"
tWLQZ
74
"
"
"
"
"
"
"
"
"
"
"
"
45
"
tWHQV
75
"
"
"
"
"
"
"
"
"
"
"
"
45
"
tELQV
76
"
"
"
"
"
"
"
"
"
"
"
"
40
"
tEHQZ
77
"
"
"
"
"
"
"
"
"
"
"
"
40
"
tWLWH
78
6/
6/
6/
6/
6/
6/
6/
"
6/
"
6/
"
40
"
tWHDC
79
"
"
"
"
"
"
"
"
"
"
"
"
5
"
tDCWL
80
"
"
"
"
"
"
"
"
"
"
"
"
5
"
tAVWL
81
"
"
"
"
"
"
"
"
"
"
"
"
10
"
tWHAC
82
"
"
"
"
"
"
"
"
"
"
"
"
5
"
tSVWL
83
"
"
"
"
"
"
"
"
"
"
"
"
5
"
tWHSC
84
"
"
"
"
"
"
"
"
"
"
"
"
5
"
Same tests, terminal conditions, and limits as subgroup 9, except TC = 125C.
10
Same tests, terminal conditions, and limits as subgroup 9, except TC = -55C.
11
See footnotes at end of table.
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