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| MIL-M-38510/245B
TABLE II. Electrical test requirements.
Line
MIL-STD-883
Class S device 1/ 2/
Class B device 1/ 2
no.
test
Table IV
Ref
Table 3/
Table 3/
Table IV
Ref
requirements
delta 4/
delta 4/
par.
III
III
par.
limits
limits
subgroups
subgroups
Interim
1
4.2f
1
4.2f
1
electrical
parameters
method 5004
Static burn-in I
2
4.2b, f
Not
method 1015
4.2g (5)
required
4.5.2
Same as line 1
Ć
3
1*
Static burn-in II
4
4.2g (5)
4.2b, h(4)
Not
method 1015
4.5.2
4.5.2
required
Same as line 1
Ć
5
4.2c
1*
Dynamic burn-in
4.2b,g(6)
5/
6
5/
method 1015
4.5.2
required
Same as line 1
Ć
Ć
7
4.2c
1*
4.2c
1*
Final electrical
8
1*, 2, 3
1*, 2, 3
parameters
8, 9, 10, 11
8, 9,
method 5004
Group A test
9
4.4.1
1, 2, 3, 4,
4.4.1
1, 2, 3, 4,
requirements
8, 9, 10,
9, 10, 11
method 5005
11, 12
Group B test
Ć
10
4.4.2
1, 2, 3, 8,
requirements
4.5.3
9, 10, 11
method 5005
Group C end-point
Ć
11
4.4.3
1,2
electrical
4.5.3
parameters
method 5005
Group D end-point
4.4.4
1, 2, 3
4.4.4
1, 2
12
electrical
parameters
method 5005
Group E test
13
4.5.6
Table VI
4.5.6
Table VI
requirements
method 1019
1/
Blank spaces indicate tests are not applicable.
2/
For subgroups 9, 10, and 11, only the worst value measured per device need be recorded when variables data is required
(e.g., during qualification).
3/
(*) indicates PDA applies to subgroup 1 (see 4.2.1).
(Ć) indicates delta limits shall be required, and delta values shall be computed with reference to either the initial recorded
4/
electrical parameters (see 4.5.3), or to the previous interim electrical parameters, as indicated to the qualifying activity.
5/
The device manufacturer may, at their option, either perform delta measurements or within 24 hours after burn-in (removal
of temperature of bias) perform the final electrical parameter measurements, subgroup A1.
12
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