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Page Title:
Table 3. Group A inspection for device type 02-cont. |
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|  TABLE III. Group A inspection for device type 02 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
MIL-STD- Cases E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Measured
Test Limits
Unit
terminal
Subgroup
Symbol
883
Cases 2, X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
method
Test no.
CLR
J
BIN
CIN
DIN
GND
Shift
CLK
Min
Max
AIN
QD
QC
QB
QA
VCC
K
QD
load
9
tPHL1
3003
105
J
J
J
GND
J
IN
OUT 5.0 V
CLK to QA
5
27
ns
TC = 25C
(Fig. 5)
106
"
See
See
"
"
"
OUT
"
CLK TO QB
"
"
"
Fig. 5
Fig. 5
107
"
"
"
"
"
"
OUT
"
CLK TO QC
"
"
"
108
"
"
"
"
"
"
OUT
"
CLK TO QD
"
"
"
109
"
"
"
"
"
"
OUT
"
"
"
"
CLK TO Q D
110
"
IN
"
GND
"
OUT
"
CLK TO QA
"
"
"
111
"
IN
"
"
"
OUT
"
CLK TO QB
"
"
"
112
"
IN
"
"
"
OUT
"
CLK TO QC
"
"
"
113
"
IN
"
"
"
OUT
"
CLK TO QD
"
"
"
114
"
IN
"
"
"
OUT
CLK TO QD
"
"
"
tPHL1
115
"
GND
GND
"
J
"
OUT
"
CLK TO QA
"
31
"
116
"
See
See
"
"
"
OUT
"
CLK TO QB
"
"
"
Fig. 5
Fig. 5
117
"
"
"
"
"
"
OUT
"
CLK TO QC
"
"
"
118
"
"
"
"
"
"
OUT
"
CLK TO QD
"
"
"
119
"
"
"
"
"
"
OUT
"
"
"
"
CLK TO Q D
120
"
IN
"
GND
"
OUT
"
CLK TO QA
"
"
"
121
"
IN
"
"
"
OUT
"
CLK TO QB
"
"
"
122
"
IN
"
"
"
OUT
"
CLK TO QC
"
"
"
123
"
IN
"
"
"
OUT
"
CLK TO QD
"
"
"
124
"
IN
"
"
"
OUT
"
"
"
"
CLK TO Q D
tPHL2
125
IN
J
"
"
"
OUT
"
CLK TO QA
"
35
"
126
"
J
"
"
"
OUT
"
CLK TO QB
"
"
"
127
"
J
"
"
"
OUT
"
CLK TO QC
"
"
"
128
"
J
"
"
"
OUT
"
CLK TO QD
"
"
"
tPHL2
129
"
J
"
"
"
OUT
"
"
"
"
CLR TO Q D
10
fMAX
25
MHz
130 to 134
TC = 125C See G
135 to 144 Same tests and terminal conditions as for subgroup 9
5
41
ns
tPLH1
145 to 154
"
47
"
tPHL1
155 to 158
"
53
"
tPHL2
159
tPHL2
"
53
"
Same tests, terminal conditions, and limits as subgroups 10, except TC = -55C.
11
See footnotes at end of device type 02.
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