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| TABLE III. Group A inspection for device type 03 - Continued
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
Measured
Test Limits
Unit
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
terminal
MIL-STD-
A,B,C,D
Subgroup
Symbol
883
Cases 2, X
2
3
4
5
8
9
10
12
13
14
16
18
19
20
method
Test no.
Serial
AIN
BIN
CIN
DIN
Mode
GND
CLK2
CLK1
QD
QC
QB
QA
VCC
Min
Max
1
IIL2
3009
35
0.4 V
GND
GND
5.5 V
Serial
1/
1/
mA
Tc = 25C
36
0.4 V
4.5 V
"
"
A
"
"
"
37
0.4 V
"
"
"
B
"
"
"
38
0.4 V
"
"
"
C
"
"
"
39
0.4 V
"
"
"
D
"
"
"
40
0.4 V
"
4.5 V
"
Mode
"
"
"
IIL4
41
4.5 V
"
0.4 V
"
CLK2
"
"
"
42
GND
"
0.4 V
"
CLK1
"
"
"
I0S
3011
43
4.5 V
4.5 V
4.5 V
4.5 V
4.5 V
"
A
GND
GND
"
QA
-15
-100
"
44
"
"
"
"
"
"
"
"
GND
"
QB
"
"
"
45
"
"
"
"
"
"
"
"
GND
"
QC
"
"
"
46
"
"
"
"
"
"
"
"
GND
"
QD
"
"
"
ICC
3005
47
GND
GND
GND
GND
5.5 V
"
"
A
"
VCC
21
"
Same tests, terminal conditions and limits as subgroup 1, except TC = 125C and VIC tests are omitted.
2
Same tests, terminal conditions and limits as subgroup 1, except TC = -55C and VIC tests are omitted.
3
7
Truth
3014
48
B
B
B
B
B
B
GND
B
C
X
X
X
X
5.0 V
All
TC = 25C table
49
B
B
B
B
B
"
"
C
"
H
H
H
H
"
outputs
test
50
"
B
B
B
B
"
"
B
"
H
H
H
H
"
"
51
"
C
C
C
C
"
"
B
"
H
H
H
H
"
"
52
"
C
C
C
C
"
"
C
"
L
L
L
L
"
"
53
"
B
B
B
B
C
"
"
B
"
"
"
L
"
"
See B,C,D, and E
54
"
C
C
C
C
"
"
"
B
"
"
"
L
"
"
55
"
"
"
"
"
"
"
"
C
"
"
"
H
"
"
56
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
57
"
"
"
"
"
"
"
"
C
"
"
H
"
"
"
58
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
59
"
"
"
"
"
"
"
"
C
"
H
"
"
"
"
60
"
"
"
"
"
"
"
"
B
"
H
"
"
"
"
61
"
"
"
"
"
"
"
"
C
H
H
"
"
"
"
See footnotes at end of device type 03.
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