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| TABLE III. Group A inspection for device type 03 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
Measured
Limits
Unit
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
terminal
MIL-STD-
A,B,C,D
Subgroup
Symbol
883
Cases 2, X
2
3
4
5
8
9
10
12
13
14
16
18
19
20
method
Test no.
Serial
AIN
BIN
CIN
DIN
Mode
GND
CLK2
CLK1
QD
QC
QB
QA
VCC
Min
Max
7
Truth
3014
62
B
C
C
C
C
C
GND
C
B
H
H
H
H
5.0 V
All
Tc = 25C table
63
C
B
B
B
B
"
"
B
B
"
"
"
H
"
outputs
tests
64
"
"
"
"
"
"
"
"
C
"
"
"
L
"
"
65
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
66
"
"
"
"
"
"
"
"
C
"
"
L
"
"
"
67
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
68
"
"
"
"
"
"
"
"
C
"
L
"
"
"
"
See B,C,D, and E
69
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
70
"
"
"
"
"
"
"
"
C
L
"
"
"
"
"
71
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
72
"
"
"
"
"
B
"
C
"
"
"
"
"
"
"
73
"
"
"
"
"
C
"
C
"
"
"
"
"
"
"
74
"
"
"
"
"
C
"
B
"
"
"
"
"
"
"
75
"
"
"
"
"
B
"
B
"
"
"
"
"
"
"
76
"
"
"
"
"
B
"
C
B
H
H
H
H
"
"
77
"
"
"
"
"
C
"
C
"
"
"
"
"
"
"
78
"
"
"
"
"
C
"
B
"
"
"
"
"
"
"
79
"
"
"
"
"
B
"
B
"
"
"
"
"
"
"
Same tests, terminal conditions, and limits as subgroup 7 except TC = 125C and -55C.
8
9
fMAX
(Fig. 6)
80
IN
G
GND
IN
OUT
5.0 V
QA
22
MHz
TC = 25C See F,J
81
IN
"
"
"
OUT
"
QB
"
"
82
IN
"
"
"
OUT
"
QC
"
"
83
IN
"
"
"
OUT
"
QD
"
"
84
IN
GND
"
IN
OUT
"
QA
"
"
tPLH1
3003
85
IN
G
"
IN
OUT
"
CLK to QA
5
32
ns
(Fig. 6)
86
IN
"
"
"
OUT
"
CLK to QB
"
"
"
87
IN
"
"
"
OUT
"
CLK to QC
"
"
"
88
IN
"
"
"
OUT
"
CLK to QD
"
"
"
89
IN
GND
"
IN
OUT
"
CLK to QA
"
"
"
90
"
"
"
"
OUT
"
CLK to QB
"
"
"
91
"
"
"
"
OUT
CLK to QC
"
"
"
92
"
"
"
"
OUT
"
CLK to QD
"
"
"
tPLH1
93
IN
G
"
IN
OUT
"
CLK to QA
"
37
"
94
IN
"
"
"
OUT
"
CLK to QB
"
"
"
95
IN
"
"
"
OUT
"
CLK to QC
"
"
"
96
IN
"
"
"
OUT
"
CLK to QD
"
"
"
97
IN
GND
"
IN
OUT
"
CLK to QA
"
"
"
98
"
"
"
"
OUT
"
CLK to QB
"
"
"
99
"
"
"
"
OUT
"
CLK to QC
"
"
"
100
"
"
"
"
OUT
"
CLK to QD
"
"
"
See footnotes at end of device type 03.
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