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Page Title:
Table 3. Group A inspection for device type 05-cont. |
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|  TABLE III. Group A inspection for device type 05 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Measured
Limits
Unit
MIL-STD-
A,B,C,D
terminal
Subgroup
Symbol
883
Cases 2, X
2
3
4
6
8
9
10
12
13
14
16
18
19
20
method
Test no.
AIN
BIN
QA
QB
QC
QD
GND
CLK
CLR
QE
QF
QG
QH
VCC
Min
Max
Same tests, terminal conditions, and limits as subgroup 7 except TC = 125C and -55C.
8
9
fMAX
(Fig. 8)
82
IN
G
OUT
GND
IN
G
5.0 V
QA
22
MHz
TC = 25C See
note F
tPLH1
3003
83
IN
G
OUT
"
"
"
"
CLK TO QA
5
32
ns
(Fig. 8)
84
See
See
OUT
"
"
"
CLK TO QB
"
"
"
fig. 8
fig. 8
85
"
"
OUT
"
"
"
"
CLK TO QC
"
"
"
86
"
"
OUT
"
"
"
"
CLK TO QD
"
"
"
87
"
"
"
"
"
OUT
"
CLK TO QE
"
"
"
88
"
"
"
"
"
OUT
"
CLK TO QF
"
"
"
89
"
"
"
"
"
OUT
"
CLK TO QG
"
"
"
90
"
"
"
"
"
OUT
"
CLK TO QH
"
"
"
tPHL1
91
"
"
OUT
"
"
"
"
CLK TO QA
"
37
ns
92
"
"
OUT
"
"
"
"
CLK TO QB
"
"
"
93
"
"
OUT
"
"
"
"
CLK TO QC
"
"
"
94
"
"
OUT
"
"
"
"
CLK TO QD
"
"
"
95
"
"
"
"
"
OUT
"
CLK TO QE
"
"
"
96
"
"
"
"
"
OUT
"
CLK TO QF
"
"
"
97
"
"
"
"
"
OUT
"
CLK TO QG
"
"
"
98
"
"
"
"
"
OUT
"
CLK TO QH
"
"
"
tPHL2
99
G
G
OUT
"
"
IN
"
CLK TO QA
"
41
"
100
"
"
OUT
"
"
"
"
CLK TO QB
"
"
"
101
"
"
OUT
"
"
"
"
CLK TO QC
"
"
"
102
"
"
OUT
"
"
"
"
CLK TO QD
"
"
"
103
"
"
"
"
"
OUT
"
CLK TO QE
"
"
"
104
"
"
"
"
"
OUT
"
CLK TO QF
"
"
"
105
"
"
"
"
"
OUT
"
CLK TO QG
"
"
"
106
"
"
"
"
"
OUT
"
CLK TO QH
"
"
"
10
fMAX
(Fig. 8)
107
20
MHz
TC = 125C See F
3003
108 to 115
5
48
ns
tPLH1
(Fig. 8)
3003
116 to 123
5
66
ns
tPHL1
(Fig. 8)
3003
124 to 131
5
62
ns
tPHL2
(Fig. 8)
Same tests, terminal conditions, and limits as subgroup 10, except TC = -55C.
11
See footnotes at end of device type 05.
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