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Page Title:
Table 3. Group A inspection for device type 06-cont. |
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|  TABLE III. Group A inspection for device type 06 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Measured
Limits
Unit
MIL-STD-
A,B,C,D
terminal
Subgroup
Symbol
883
Cases 2, X
2
3
4
5
8
9
10
12
13
14
16
18
19
20
method
Test no.
Serial
AIN
BIN
CN
DIN
Mode
GND
CONT
CLK
QD
QC
QB
QA
VCC
Min
Max
9
tZL
(Fig. 9)
97
GND
G
GND
IN
IN
OUT
5.0 V
CONT to QA
5
35
ns
TC = 25C
98
GND
"
"
"
"
OUT
"
CONT TO QB
"
"
"
99
GND
"
"
"
"
OUT
"
CONT TO QC
"
"
"
100
GND
"
"
"
"
OUT
"
CONT TO QD
"
"
"
tZH
101
G
"
"
"
"
OUT
"
CLK TO QA
"
30
"
102
G
"
"
"
"
OUT
"
CLK TO QB
"
"
"
103
G
"
"
"
"
OUT
"
CLK TO QC
"
"
"
104
G
"
"
"
"
OUT
"
CLK TO QD
"
"
"
tLZ
105
GND
"
"
"
"
OUT
"
CLK TO QA
"
55
"
106
GND
"
"
"
"
OUT
"
CLK TO QB
"
"
"
107
GND
"
"
"
"
OUT
"
CLK TO QC
"
"
"
108
GND
"
"
"
"
OUT
"
CLK TO QD
"
"
"
tHZ
109
G
"
"
"
"
OUT
"
CLK TO QA
"
65
"
110
G
"
"
"
"
OUT
"
CLK TO QB
"
"
"
111
G
"
"
"
"
OUT
"
CLK TO QC
"
"
"
112
G
"
"
"
"
OUT
"
CLK TO QD
"
"
"
10
fMAX
113
18
MHz
TC =125C See F
3003
114 to 121
5
46
ns
tPLH1
(Fig. 9)
122 to 129
"
52
"
tPHL1
Same test and terminal conditions as subgroup 9.
130 to 133
"
45
"
tZL
134 to 137
"
39
"
tZH
138 to 141
"
71
"
tLZ
142 to 145
84
"
tHZ
"
Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55C.
11
See footnotes at end of device type 06.
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