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| TABLE III. Group A inspection for device type 07 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0; or low ≤ 0.7 V; or open).
MIL-STD- Cases E,F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Test Limits
883
Subgroup
Symbol
Cases 2,X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Measured
Unit
method
Test no.
CLR
Serial
AIN
BIN
CIN
DIN
Load
GND
CONT
CLK
QD'
QD
QC
QB
QA
VCC
terminal
Min
Max
1
IIL1
3009
46
0.4 V
GND
5.5 V
CLR
1/
1/
mA
Tc = 25C
47
B
0.4 V
GND
"
A
"
Serial
"
"
"
48
0.4 V
4.5 V
"
"
AIN
"
"
"
49
0.4 V
"
"
"
BIN
"
"
"
50
0.4 V
"
"
"
CIN
"
"
"
51
0.4 V
"
"
"
DIN
"
"
"
52
0.4 V
"
"
Load
"
"
"
53
4.5 V
"
0.4 V
"
CONT
"
"
"
54
"
"
0.4 V
"
CLK
"
"
"
IOS
3011
55
4.5 V
GND
4.5 V
4.5 V
4.5 V
4.5 V
"
"
GND
A
GND
"
QA
2/
2/
"
56
"
"
"
"
"
"
"
"
"
"
GND
"
QB
"
"
"
57
"
"
"
"
"
"
"
"
"
"
GND
"
QC
"
"
"
58
"
"
"
"
"
"
"
"
"
"
GND
"
QD
"
"
"
59
"
"
"
"
"
"
"
"
"
"
GND
"
QD'
"
"
"
ICC
3005
60
5.5 V
5.5 V
GND
GND
GND
GND
5.5 V
"
5.5 V
"
"
VCC
34
"
ICC
3005
61
GND
5.5 V
GND
GND
GND
GND
5.5 V
"
GND
GND
"
VCC
31
"
Same tests, terminal conditions and limits as subgroup 1, except TC = 125C and VIC tests are omitted.
2
Same tests, terminal conditions and limits as subgroup 1, except TC = -55C and VIC tests are omitted.
3
7
Truth
3014
62
D
C
C
C
C
C
C
GND
D
C
L
L
L
L
L
5.0v
All
See C,D,E, and F
TC = 25 C table
63
D
D
D
D
D
D
D
"
"
D
"
"
"
"
"
"
outputs
test
64
D
C
C
C
C
C
C
"
"
C
"
"
"
"
"
"
"
65
C
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
66
C
"
"
"
"
"
"
"
"
D
H
H
H
H
H
"
"
67
C
"
"
"
"
"
"
"
"
C
H
H
H
H
H
"
"
See footnotes at end of device types 07.
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