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Page Title:
Table 3. Group A inspection for device type 07 |
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|  TABLE III. Group A inspection for device type 07 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
MIL-STD- Cases E,F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Test Limits
883
Subgroup Symbol
Cases 2,X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20 Measured
Unit
method
Test no.
CLR
Serial
AIN
BIN
CIN
DIN
Load
GND
CONT
CLK
QD'
QD
QC
QB
QA
VCC
terminal
Min
Max
1
VOH
3006
1
2.0 V
2.0 V 2.0 V 2.0 V 2.0 V 2.0 V
GND
0.7 V
A
-.1 mA 4.5 V
QA
2.4
V
Tc = 25C
2
"
"
"
"
"
"
"
"
"
-.1 mA
"
QB
"
"
3
"
"
"
"
"
"
"
"
"
-.1 mA
"
QC
"
"
4
"
"
"
"
"
"
"
"
"
-.1 mA
"
QD
"
"
5
"
"
"
"
"
"
"
"
"
-.4 mA
"
QD'
2.5
"
VOL
3007
6
"
0.7 V 0.7 V 0.7 V 0.7 V
"
"
"
"
12 mA
"
QA
0.4
"
7
"
"
"
"
"
"
"
"
"
12 mA
"
QB
"
"
8
"
"
"
"
"
"
"
"
"
12 mA
"
QC
"
"
9
"
"
"
"
"
"
"
"
"
12 mA
"
QD
"
"
10
"
"
"
"
"
"
"
"
"
4 mA
"
QD'
"
"
VIC
11
-18 mA
"
"
CLR
-1.5
"
12
-18 mA
"
"
Serial
"
"
13
-18 mA
"
"
AIN
"
"
14
-18 mA
"
"
BIN
"
"
15
-18 mA
"
"
CIN
"
"
16
-18 mA
"
"
DIN
"
"
17
-18 mA
"
"
Load
"
"
18
"
-18 mA
"
CONT
"
"
19
"
-18 mA
"
CLK
"
"
Α
IIH1
3010
20
2.7 V
"
5.5 V
CLR
20
21
2.7 V
4.5 V
"
"
Serial
"
"
22
2.7 V
GND
"
"
AIN
"
"
23
2.7 V
"
"
"
BIN
"
"
24
2.7 V
"
"
"
CIN
"
"
25
2.7 V
"
"
"
DIN
"
"
26
2.7 V
"
"
Load
"
"
27
GND
"
2.7 V
"
CONT
"
"
28
GND
"
2.7 V
"
CLK
"
"
IIH2
29
5.5 V
"
"
CLR
100
"
30
5.5 V
4.5 V
"
"
Serial
"
"
31
5.5 V
GND
"
"
AIN
"
"
32
5.5 V
"
"
"
BIN
"
"
33
5.5 V
"
"
"
CIN
"
"
34
5.5 V
"
"
"
DIN
"
"
35
5.5 V
'
"
Load
"
"
36
GND
"
5.5 V
"
CONT
"
"
37
GND
"
5.5 V
"
CLK
"
"
IOZH
38
2.0 V
0.7 V 0.7 V 0.7 V 0.7 V 2.0 V
"
2.0 V
A
2.7 V
"
QA
20
"
39
"
"
"
"
"
"
"
"
"
2.7 V
"
QB
"
"
40
"
"
"
"
"
"
"
"
"
2.7 V
"
QC
"
"
41
"
"
"
"
"
"
"
"
"
2.7 V
"
QD
"
"
IOZL
42
"
2.0 V 2.0 V 2.0 V 2.0 V
"
"
"
"
0.4 V
"
QA
-20
"
43
"
"
"
"
"
"
"
"
"
0.4 V
"
QB
"
"
44
"
"
"
"
"
"
"
"
"
0.4 V
"
QC
"
"
45
"
"
"
"
"
"
"
"
"
0.4 V
"
QD
"
"
See footnotes at end of device types 07.
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