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Page Title:
Table 3. Group A inspection for device type 08 |
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|  TABLE III. Group A inspection for device type 08
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
MIL-STD- Cases E,F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Test Limits
883
Subgroup
Symbol
Cases 2,X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Measured
Unit
method
Test no.
Shift
CLK
E
F
G
H
GND
QH
Serial
A
B
C
D
CLK
VCC
terminal
Min
Max
QH
Load
INP
INHB
1
VOH
3006
1
0.7 V
2.0 V
GND
-.4 mA
4.5 V
QH
2.5
V
Tc = 25C
2.5
"
3006
2
"
0.7 V
-.4 mA
"
"
QH
VOL
3007
3
"
0.7 V
"
4 mA
"
QH
0.4
"
3007
4
"
2.0 V
4 mA
"
"
0.4
"
QH
VIC
5
-18 mA
"
"
S/L
-1.5 V
"
6
-18 mA
"
"
CLK
"
"
7
-18 mA
"
"
E
"
"
8
-18 mA
"
"
F
"
"
9
-18 mA
"
"
G
"
"
10
-18 mA
"
"
H
"
"
11
"
-18 mA
"
S/INP
"
"
12
"
-18 mA
"
A
"
"
13
"
-18 mA
"
B
"
"
14
"
-18 mA
"
C
"
"
15
"
-18 mA
"
D
"
"
16
"
-18 mA
"
CLK/INHB
"
"
"
IIL1
3009
17
0.4 V
5.5 V
CLK
1/
1/
mA
IIL6
18
GND
0.4 V
"
"
E
"
"
"
19
"
0.4 V
"
"
F
"
"
"
20
"
0.4 V
"
"
G
"
"
"
21
"
0.4 V
"
"
H
"
"
"
22
"
0.4 V
"
S/INP
"
"
"
23
GND
"
0.4 V
"
A
"
"
"
24
"
0.4 V
"
B
"
"
"
25
"
0.4 V
"
C
"
"
"
26
"
0.4 V
"
D
"
"
"
See footnotes at end of device types 08.
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