 |
|||
|
Page Title:
Figure 4. Waveforms for propagation delay time and test circuit for device type 01-cont. |
|
||
| ||||||||||
|
|  MIL-M-38510/308B
SUM MODE TEST TABLE
FUNCTION INPUTS: S0 = S3 = 4.5 V, S1 = S2 = M = 0 V
TEST
INPUT
OTHER INPUT
OTHER DATA INPUTS
OUTPUT
OUTPUT
UNDER
SAME BIT
UNDER
WAVEFORM
TEST
APPLY 4.5 V
APPLY GND
APPLY 4.5 V
APPLY GND
TEST
None
Remaining
Cn
1
tPLH1
A i 1/
Bi
Any F i
tPHL1
A and B
None
Remaining
Cn
1
tPLH1
Bi
Ai
Any F i
tPHL1
A and B
None
None
Remaining
1
tPLH3
Ai
Bi
P
tPHL3
A and B , Cn
None
None
Remaining
1
tPLH3
Bi
Ai
P
tPHL3
A and B , Cn
None
Remaining
Remaining
tPLH5
1
Ai
Bi
G
tPHL5
A , Cn
B
None
Remaining
Remaining
tPLH5
1
Bi
Ai
G
tPHL5
A , Cn
B
1
tPLH7
Cn
None
None
All
All
Any F i
tPHL7
A
B
tPLH9
Cn
None
None
All
All
Cn+4
1
tPHL9
A
B
None
Remaining
Remaining
Cn+4
2
tPLH11
Ai
Bi
tPHL11
A , Cn
B
None
Remaining
Remaining
Cn+4
2
tPLH11
Bi
Ai
tPHL11
A , Cn
B
1/ In A i, B i, and F i i = 0, 1, 2, 3.
FIGURE 4. Waveforms for propagation delay time and test circuit for device type 01 - Continued.
13
|
|
Privacy Statement - Press Release - Copyright Information. - Contact Us |
Click
here for thousands of PDF manuals