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| ![]() TABLE III. Group A inspection for device type 01.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.8 V; or open).
MIL-STD-
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Limits
883
A,B,C,D
method
Subgroup
Symbol
Cases 2 1/
2
3
4
6
8
9
10
12
13
14
16
18
19
20
Measured
Unit
and X
Test no.
D1
CP1
Q1
GND
Q2
CP2
D2
VCC
terminal
Min
Max
CD
SD
Q
Q
SD
CD 2
1
1
1
2
2
1
VOL
3007
1
4.5 V
.8 V
2/
2/
20 mA
"
4.5 V
Q1
.5
V
Tc = 25C
2
.8 V
2.0 V
20 mA
"
"
Q1
"
"
3
2.0 V
.8 V
20 mA
"
"
"
"
Q
1
4
"
20 mA
.8 V
2.0 V
"
"
"
Q 2
5
"
20 mA
2.0 V
.8 V
"
Q2
"
"
6
"
20 mA
2/
2/
.8 V
4.5 V
"
Q2
"
"
VOH
3006
7
2.0 V
.8 V
-1 mA
"
"
Q1
2.5
"
8
3/
2.0 V
3/
4.5 V
-1 mA
"
"
Q1
"
"
9
.8 V
2.0 V
-1 mA
"
"
"
"
Q
1
10
"
-1 mA
2.0 V
.8 V
"
"
"
Q 2
11
"
-1 mA
.8 V
2.0 V
"
Q2
"
"
12
"
-1 mA
4.5 V
3/
2.0 V
3/
"
Q2
"
"
VIC
13
-18 mA
"
"
-1.2
"
CD 1
14
-18 mA
"
"
D1
"
"
15
-18 mA
"
"
CP1
"
"
16
-18 mA
"
"
"
"
SD
1
17
"
-18 mA
"
"
"
SD 2
18
"
-18 mA
"
CP2
"
"
19
"
-18 mA
"
D2
"
"
"
"
20
"
-18 mA
"
CD 2
A
IIH1
3010
21
2.7 V
0V
0V
4.5 V
"
5.5 V
20
CD 1
22
2.7 V
0V
4/
"
"
"
"
"
CD 1
23
0V
2.7 V
4.5 V
"
"
"
D1
"
"
24
4.5 V
4.5 V
2.7 V
0V
"
"
CP1
"
"
25
0V
"
2.7 V
4.5 V
"
"
CP1
"
"
26
4.5 V
"
4/
2.7 V
"
"
"
"
SD
1
"
"
27
"
2.7 V
4/
4.5 V
4.5 V
"
SD 2
28
"
0V
2.7 V
"
4.5 V
"
CP2
"
"
29
"
4.5 V
2.7 V
"
0V
"
CP2
"
"
30
"
"
4.5 V
2.7 V
0V
"
D2
"
"
31
"
"
0V
0V
2.7 V
"
"
"
CD 2
32
"
"
4/
0V
2.7 V
"
"
"
CD 2
IIH2
3010
33
7.0 V
0V
0V
4.5 V
"
"
100
"
CD 1
34
7.0 V
0V
4/
"
"
"
"
"
CD 1
35
0V
7.0 V
4.5 V
"
"
"
D1
"
"
36
4.5 V
4.5 V
7.0 V
0V
"
"
CP1
"
"
37
0V
"
7.0 V
4.5 V
"
"
CP1
"
"
38
4.5 V
"
4/
7.0 V
"
"
"
"
SD
1
"
39
"
7.0 V
4/
4.5 V
4.5 V
"
"
SD 2
40
"
0V
7.0 V
"
4.5 V
"
CP2
"
"
41
"
4.5 V
7.0 V
"
0V
"
CP2
"
"
42
"
"
4.5 V
7.0 V
0V
"
D2
"
"
43
"
"
0V
0V
7.0 V
"
"
"
CD 2
44
"
"
4/
0V
7.0 V
"
"
"
CD 2
See footnotes at end of device type 01.
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