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| ![]() TABLE III. Group A inspection for device type 05.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.8 V; or open).
Subgroup
Symbol
MIL-STD- Cases 2,R,
1
2
3
4
5
6
7
8
9
10
883
S, and X
method
Test no.
Q0
D0
D1
Q1
Q2
D2
D3
Q3
GND
OE
1
IOS
3011
57
0V
0V
4.5 V
"
Tc = 25C
4.5 V
0V
"
58
"
59
"
0V
4.5 V
"
60
"
4.5 V
0V
"
61
"
"
62
"
"
63
"
"
64
"
"
IOD
65
"
2.5 V
0V
"
66
"
0V
2.5 V
"
67
"
2.5 V
0V
"
68
"
0V
2.5 V
"
69
"
"
70
"
"
71
"
"
72
"
"
IOZH
3011
73
2.0 V
2.7 V
0V
"
74
"
0V
2.7 V
"
75
"
2.7 V
0V
"
76
"
0V
2.7 V
"
77
"
"
78
"
"
79
"
"
80
"
"
IOZL
3011
81
"
.5 V
4.5 V
"
82
"
4.5 V
.5 V
"
83
"
.5 V
4.5 V
"
84
"
4.5 V
.5 V
"
85
"
"
86
"
"
87
"
"
88
"
"
ICCZ
3011
89
4.5 V
4.5 V
4.5 V
4.5 V
4.5 V
"
Same tests, terminal conditions, and limits as for subgroup 1, except TC = +125C and VIC tests are omitted.
2
Same tests, terminal conditions, and limits as for subgroup 1, except TC = -55C and VIC tests are omitted.
3
7
Func
3014
90
B
X
B
B
X
X
B
B
X
"
TC = +25C tional
91
"
L
B
B
L
L
B
B
L
"
tests
92
"
"
A
A
"
"
A
A
"
"
3/
93
"
"
"
"
"
"
"
"
"
"
94
"
H
"
"
H
H
"
"
H
"
95
"
"
B
B
"
"
B
B
"
"
96
"
"
"
"
"
"
"
"
"
"
97
"
L
"
"
L
L
"
"
L
"
98
"
"
A
A
"
"
A
A
"
"
99
"
"
B
B
"
"
B
B
"
"
100
"
L
A
A
"
"
A
A
"
"
101
"
H
A
A
H
H
A
A
H
"
102
"
"
B
B
"
"
B
B
"
"
103
"
"
A
A
"
"
A
A
"
"
Same tests, terminal conditions, and limits as for subgroup 7, except TC = +125C and TC = -55C.
8
See footnotes at end of device type 05.
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