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Page Title:
Table III. Group A inspection for device type 05-cont. |
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|  TABLE III. Group A inspection for device type 05 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.8 V; or open).
MIL-STD- Case 2, R,
11
12
13
14
15
16
17
18
19
20
Measured
Limits
Subgroup
Symbol
S, and X
883
method
Test no.
CP
Q4
D4
D5
Q5
Q6
D6
D7
Q7
VCC
terminal
Min
Max
1
IOS
3011
57
1/
5.5 V
Q0
-60
-150
mA
Tc = +25C
Q1
"
"
"
58
"
"
59
"
"
Q2
"
"
"
60
"
"
Q3
"
"
"
61
"
0V
4.5 V
"
Q4
"
"
"
62
"
4.5 V
0V
"
Q5
"
"
"
63
"
0V
4.5 V
"
Q6
"
"
"
64
"
4.5 V
0V
"
Q7
"
"
"
IOD
65
"
4.5 V
Q0
35
"
66
"
"
Q1
"
"
67
"
"
Q2
"
"
68
"
"
Q3
"
"
69
"
2.5 V
0V
"
Q4
"
"
70
"
0V
2.5
"
Q5
"
"
71
"
2.5 V
0V
"
Q6
"
"
72
"
0V
2.5 V
"
Q7
"
"
A
IOZH
3011
73
"
5.5 V
Q0
+ 50
74
"
"
Q1
"
"
75
"
"
Q2
"
"
76
"
"
Q3
"
"
77
"
2.7 V
0V
"
Q4
"
"
78
"
0V
2.7 V
"
Q5
"
"
79
"
2.7 V
0V
"
Q6
"
"
80
"
0V
2.7 V
"
Q7
"
"
IOZL
3011
81
"
"
Q0
-50
"
82
"
"
Q1
"
"
83
"
"
Q2
"
"
84
"
"
Q3
"
"
85
"
.5 V
4.5 V
"
Q4
"
"
86
"
4.5 V
.5 V
"
Q5
"
"
87
"
.5 V
4.5 V
"
Q6
"
"
88
"
4.5 V
.5 V
"
Q7
"
"
ICCZ
3011
89
4.5 V
4.5 V
4.5 V
4.5 V
4.5 V
"
VCC
86
mA
Same tests, terminal conditions, and limits as for subgroup 1, except TC = +125C and VIC tests are omitted.
2
Same tests, terminal conditions, and limits as for subgroup 1, except TC = -55C and VIC tests are omitted.
3
7
Func-
3014
90
B
X
B
B
X
X
B
B
X
4/
All
TC = +25C Tional
91
A
L
B
B
L
L
B
B
L
"
outputs
Tests
92
A
"
A
A
"
"
A
A
"
"
"
3/
93
B
"
"
"
"
"
"
"
"
"
"
94
A
H
"
"
H
H
"
"
H
"
"
95
A
"
B
B
"
"
B
B
"
"
"
96
B
"
"
"
"
"
"
"
"
"
"
97
A
L
"
"
L
L
"
"
L
"
"
98
"
"
A
A
"
"
A
A
"
"
"
99
"
"
B
B
"
"
B
B
"
"
"
100
B
"
A
A
"
"
A
A
"
"
"
101
A
H
A
A
H
H
A
A
H
"
"
102
"
"
B
B
"
"
B
B
"
"
"
103
"
"
A
A
"
"
A
A
"
"
"
Same tests, terminal conditions, and limits as for subgroup 7, except TC = +125C and TC = -55C.
8
See footnotes at end of device type 05.
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