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Page Title:
Table III. Group A inspection for device type 05-cont. |
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|  TABLE III. Group A inspection for device type 05.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.8 V; or open).
MIL-STD- Cases 2,R,
Subgroup
Symbol
1
2
3
4
5
6
7
8
9
10
883
S, and X
method
Test no.
Q0
D0
D1
Q1
Q2
D2
D3
Q3
GND
OE
9
fMAX
3003
104
0V
OUT
IN
"
Tc = +25C 5/
Fig. 4
105
"
IN
OUT
"
106
"
OUT
IN
"
107
"
IN
OUT
"
108
"
"
109
"
"
110
"
"
111
"
"
tPLH1
112
"
OUT
IN
"
113
"
IN
OUT
"
114
"
OUT
IN
"
115
"
IN
OUT
"
116
"
"
117
"
"
118
"
"
119
"
"
tPHL1
120
"
OUT
IN
"
121
"
IN
OUT
"
122
"
OUT
IN
"
123
"
IN
OUT
"
124
"
"
125
"
"
126
"
"
127
"
"
tPLZ1
128
IN
OUT
0V
"
129
"
0V
OUT
"
130
"
OUT
0V
"
131
"
0V
OUT
"
132
"
"
133
"
"
134
"
"
135
"
"
tPHZ1
136
"
OUT
2.7 V
"
137
"
2.7 V
OUT
"
138
"
OUT
2.7 V
"
139
"
2.7 V
OUT
"
140
"
"
141
"
"
142
"
"
143
"
"
tPZL1
144
"
OUT
0V
"
145
"
0V
OUT
"
146
"
OUT
0V
"
147
"
0V
OUT
"
148
"
"
149
"
"
150
"
"
151
"
"
tPZH1
152
"
OUT
2.7 V
"
153
"
2.7 V
OUT
"
154
"
OUT
2.7 V
"
155
"
2.7 V
OUT
"
156
"
"
157
"
"
158
"
"
159
"
"
Same tests, and terminal conditions, as subgroup 9, except TC = +125C and use limits from table I.
10
Same tests, and terminal conditions, as subgroup 9, except TC = -55C and use limits from table I.
11
See footnotes at end of device type 05.
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