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Page Title:
Table 3. Group A inspection for device type 02-cont. |
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|  TABLE III. Group A inspection for device type 02.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.8 V; or open).
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
MIL-STD-
E, F
Subgroup
Symbol
883
Case
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Measured
Limits
Unit
method
2 1/
terminal
Test no.
S
QA
I0A
I1A
I1B
I0B
QB
GND
CP
QC
I0C
I1C
I1D
I0D
QD
VCC
Min
Max
9
tPLH
3004
102
0.0 V
OUT
2.7 V
0.0 V
0.0 V
0.0 V
GND
IN
0.0 V
0.0 V
0.0 V
0.0 V
5.0 V
QA
1.5
7.5
ns
TC = 25C
Fig. 4
103
"
"
"
"
2.7 V
OUT
"
"
0.0 V
"
"
"
"
QB
"
"
"
"
104
"
"
"
"
"
"
"
OUT
2.7 V
"
"
"
"
QC
"
"
"
"
105
"
0.0 V
"
"
"
"
"
2.7 V
"
"
2.7 V
OUT
"
QD
"
"
"
"
106
2.7 V
OUT
"
2.7 V
"
0.0 V
"
"
0.0 V
"
"
0.0 V
"
QA
"
"
"
"
107
"
"
"
2.7 V
"
OUT
"
"
"
"
"
"
"
QB
"
"
"
"
108
"
"
"
"
"
"
"
OUT
"
2.7 V
"
"
"
QC
"
"
"
"
109
"
"
"
"
"
"
"
"
2.7 V
2.7 V
"
OUT
"
QD
"
"
"
tPHL
"
110
0.0 V
OUT
0.0 V
0.0 V
0.0 V
2.7 V
"
"
2.7 V
0.0 V
0.0 V
2.7 V
"
QA
"
9.5
"
"
111
"
"
"
"
0.0 V
OUT
"
"
2.7 V
"
"
"
"
QB
"
"
"
"
112
"
"
"
"
"
"
"
OUT
0.0 V
"
"
"
"
QC
"
"
"
"
113
"
2.7 V
"
"
"
"
"
"
"
"
0.0 V
OUT
"
QD
"
"
"
"
114
2.7 V
OUT
0.0 V
"
2.7 V
"
"
"
"
2.7 V
2.7 V
"
"
QA
"
"
"
"
115
"
"
"
0.0 V
"
OUT
"
"
"
2.7 V
"
"
"
QB
"
"
"
"
116
"
"
"
"
"
"
"
OUT
"
0.0 V
"
"
"
QC
"
"
"
"
117
"
"
"
"
"
"
"
"
0.0 V
0.0 V
"
OUT
"
QD
"
"
"
fMAX
3003
118
0.0 V
OUT
IN2
0.0 V
0.0 V
0.0 V
"
IN1
0.0 V
0.0 V
0.0 V
0.0 V
"
QA
100
MHz
6/
Fig. 5
119
"
0.0 V
"
"
IN2
OUT
"
"
0.0 V
"
"
"
"
QB
"
"
"
120
"
"
"
"
0.0 V
"
"
OUT
IN2
"
"
"
"
QC
"
"
"
121
"
"
"
"
"
"
"
0.0 V
"
"
IN2
OUT
"
QD
"
"
"
122
2.7 V
OUT
"
IN2
"
"
"
"
"
"
"
0.0 V
"
QA
"
"
"
123
"
"
0.0 V
IN2
"
OUT
"
"
"
"
"
"
"
QB
"
"
"
124
"
"
"
0.0 V
"
"
"
OUT
"
IN2
"
"
"
QC
"
"
"
125
"
"
"
0.0 V
"
"
"
"
0.0 V
IN2
"
OUT
"
QD
"
"
Same tests, terminal conditions, and limits as for subgroup 9, except TC = +125C and use limits from table I.
10
Same tests, terminal conditions and limits as for subgroup 9, except TC = -55C and use limits from table I.
11
1/
For case 2, pins not referenced are NC.
2/
Apply all voltages, then apply 3.0 V, 0.0 V, 3.0 V to CP then make measurement.
3/
Perform function sequence at VCC = 4.5 V and repeat at VCC = 5.5 V.
A = 3.0 V, B = 0.0 V or GND; H > 1.5 V, L < 1.5 V.
4/
5/
IIL limits (mA) min/max values for circuit shown:
Test
Min/Max limits in mA
CKT A
B
C
IIL
-.25/-.60
-.03/-.60
6/ fMAX shall be measured only under the conditions of initial qualification and after process or design changes which may affect this parameter.
For all other conditions, fMAX shall be guaranteed, if not tested, to the imits specified in table III, herein.
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