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Page Title:
Table 3. Group A inspection for device type 06-cont. |
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|  TABLE III. Group A inspection for device type 06.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.8 V; or open).
Symbol MIL-STD-
Subgroup
Cases
2
3
4
5
6
7
9
10
11
12
13
14
Limits
Unit
3
883
method
Cases
1
2
3
4
5
6
7
8
9
10
11
12
Measured
L, K
Test no.
1D1
1D2
1D3
1D4
2D1
2D2
2D3
2D4
terminal
Min
Max
GND
2 OC
1 CLR
1 OC
9
tPHZ
3003
180
3.5 V
IN
5.0 V
GND
2
8
ns
1 OC to 1Q1
Fig. 4
Tc = 25C
"
181
"
"
5.0 V
"
"
"
"
1 OC to 1Q2
"
182
"
"
5.0 V
"
"
"
"
1 OC to 1Q3
"
183
"
"
5.0 V
"
"
"
"
1 OC to 1Q4
"
184
5.0 V
IN
"
"
"
"
2 OC to 2Q1
"
185
5.0 V
"
"
"
"
"
2 OC to 2Q2
"
186
5.0 V
"
"
"
"
"
2 OC to 2Q3
"
187
5.0 V
"
"
"
"
"
2 OC to 2Q4
10
fMAX
30
MHz
tPHL1
6
22
ns
tPLH2
4
15
"
Same tests and terminal conditions as for subgroup 9, except TC = +125C.
tPHL2
"
"
"
tPZL
"
21
"
tPZH
"
"
"
tPLZ
3
15
"
2
10
"
tPHZ
Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55C.
11
See footnotes at end of device types 06.
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