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TABLE III. Group A inspection for device type 06.
Terminal conditions (pins not designated may be high 2.0 V; or low 0.8 V; or open).
Subgroup
Symbol MIL-STD-
Cases
16
17
18
19
20
21
23
24
25
26
27
28
Limits
Unit
3
883
method
Cases
13
14
15
16
17
18
19
20
21
22
23
24
Measured
L, K
2Q4
2Q3
2Q2
2Q1
1Q4
1Q3
1Q2
1Q1
1CLK
VCC
terminal
Min
Max
Test no.
2CLK
2 CLR
9
tPHLZ
3003
180
OUT
2/
5.0 V
2
8
ns
1 OC to 1Q1
Fig. 4
Tc = 25C
"
181
OUT
"
"
"
"
"
1 OC to 1Q2
"
182
OUT
"
"
"
"
"
1 OC to 1Q3
"
183
OUT
"
"
"
"
"
1 OC to 1Q4
"
184
3.5 V
2/
OUT
"
"
"
"
2 OC to 2Q1
"
185
"
"
OUT
"
"
"
"
2 OC to 2Q2
"
186
"
"
OUT
"
"
"
"
2 OC to 2Q3
"
187
"
"
OUT
"
"
"
"
2 OC to 2Q4
10
fMAX
30
MHz
tPHL1
6
22
ns
tPLH2
4
15
"
Same tests and terminal conditions as for subgroup 9, except TC = +125C.
tPHL2
"
"
"
tPZL
"
21
"
tPZH
"
"
"
tPLZ
3
15
"
2
10
"
tPHZ
Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55C.
11
See footnotes at end of device types 06.

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