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Page Title:
Table 3. Group A inspection for device type 07-cont. |
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|  TABLE III. Group A inspection for device type 07.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.8 V; or open).
Subgroup
Symbol MIL-STD-
Cases
16
17
18
19
20
21
23
24
25
26
27
28
Limits
Unit
3
883
method
Cases
13
14
15
16
17
18
19
20
21
22
23
24
Measured
L, K
Test no.
terminal
Min
Max
2CLK
1CLK
VCC
2 PR
2Q 4
2Q 3
2Q 2
2Q 1
1Q 4
1Q 3
1Q 2
1Q 1
9
tPLZ
3003
172
OUT
2/
5.0 V
3
13
ns
1 OC to 1 Q 1
Tc = 25C
Fig. 4
"
173
OUT
"
"
"
"
"
1 OC to 1 Q 2
"
174
OUT
"
"
"
"
"
1 OC to 1 Q 3
"
175
OUT
"
"
"
"
"
1 OC to 1 Q 4
"
176
3.5 V
2/
OUT
"
"
"
"
2 OC to 2 Q 1
"
177
"
"
OUT
"
"
"
"
2 OC to 2 Q 2
"
178
"
"
OUT
"
"
"
"
2 OC to 2 Q 3
"
179
"
"
OUT
"
"
"
"
2 OC to 2 Q 4
tPHZ
"
180
OUT
2/
"
2
8
"
1 OC to 1 Q 1
"
181
OUT
"
"
"
"
"
1 OC to 1 Q 2
"
182
OUT
"
"
"
"
"
1 OC to 1 Q 3
"
183
OUT
"
"
"
"
"
1 OC to 1 Q 4
"
184
3.5 V
2/
OUT
"
"
"
"
2 OC to 2 Q 1
"
185
"
"
OUT
"
"
"
"
2 OC to 2 Q 2
"
186
"
"
OUT
"
"
"
"
2 OC to 2 Q 3
"
187
"
"
OUT
"
"
"
"
2 OC to 2 Q 4
10
fMAX
30
MHz
Tc = 25C tPHL1
6
22
ns
tPLH2
4
15
"
Same tests and terminal conditions as for subgroup 9, except TC = +125C.
tPHL2
"
15
"
tPZL
"
21
"
tPZH
"
21
"
tPLZ
3
15
"
2
10
"
tPHZ
Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55C.
11
See footnotes at end of device types 07.
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