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Page Title:
Table 3. Group A inspection for device type 03-cont. |
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|  TABLE III. Group A inspection for device type 03.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.8 V; or open).
MIL-STD- Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
R, S, 2
Measured
Subgroup Symbol
883
Test limits
Unit
1Q
1D
2D
2Q
3Q
3D
4D
4Q
GND
ENC
5Q
5D
6D
6Q
7Q
7D
8D
8Q
VCC
method
Test no.
terminal
Min
Max
OC
9
tPLZ
3003
147
IN
OUT
GND
GND
5.0 v
2
12
ns
OC to 1Q
Tc = 25C
(fig. 5)
148
"
GND
OUT
"
"
"
"
"
OC to 2Q
"
149
"
OUT
GND
"
"
"
"
"
OC to 3Q
"
150
"
GND
OUT
"
"
"
"
"
OC to 4Q
"
151
"
"
OUT
GND
"
"
"
"
OC to 5Q
"
152
"
"
GND
OUT
"
"
"
"
OC to 6Q
"
153
"
"
OUT
GND
"
"
"
"
OC to 7Q
"
154
"
"
GND
OUT
"
"
"
"
OC to 8Q
10
tPLH2
2
14
"
tPHL2
4
19
"
tPLH3 Same tests and terminal conditions as subgroup 9, except TC = +125C.
6
21
"
tPHL3
7
21
"
tPZH
5
26
"
tPZL
6
22
"
tPHZ
2
12
"
tPLZ
2
18
"
Same tests as subgroup 10, except TC = -55C and use limits from table I.
11
1/ IIL limits shall be as follows:
Min/Max limits in A for circuit
Parameters
A
B
C
IIL
0/-200
2/ Method 3011 of MIL-STD-883 shall be used, except the output shall be as specified herein, and the output current shall be operating rather than short circuit current.
The output conditions have been chosen to produce a current that closely approximates one half of the true short circuit output current, IOS.
3/ Tests shall be performed in sequence, attributes data only.
4/ A = 2.4 V and B = 0.4 V.
5/ H > 1.5 V, L < 1.5 V.
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