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| TABLE III. Group A inspection for device type 04.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.8 V; or open).
MIL-STD- Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
Subgroup Symbol
883
R, S, 2
Measured
Test limits
Unit
method
Test no.
1Q
1D
2D
2Q
3Q
3D
4D
4Q
GND
CLK
5Q
5D
6D
6Q
7Q
7D
8D
8Q
VCC
terminal
Min
Max
OC
1
VOH
3006
1
0.8 V -1 mA
2.0 V
GND
1/
4.5 V
1Q
2.4
V
Tc = 25C
"
"
2
"
2.0 V
-1 mA
"
"
2Q
"
"
"
"
3
"
-1 mA
2.0 V
"
"
3Q
"
"
"
"
4
"
2.0 V
-1 mA
"
"
4Q
"
"
"
"
5
"
"
-1 mA
2.0 V
"
5Q
"
"
"
"
6
"
"
2.0 V
-1 mA
"
6Q
"
"
"
"
7
"
"
-1 mA
2.0 V
"
7Q
"
"
"
"
8
"
"
2.0 V
-1 mA
"
8Q
"
"
"
VOL
3007
9
"
12 mA
0.8 V
"
"
1Q
0.4
"
"
10
"
0.8 V
12 mA
"
"
"
2Q
"
"
"
11
"
12 mA
0.8 V
"
"
"
3Q
"
"
"
12
"
0.8 V
12 mA
"
"
"
4Q
"
"
"
"
13
"
"
12 mA
0.8 V
"
5Q
"
"
"
"
14
"
"
0.8 V
12 mA
"
6Q
"
"
"
"
15
"
"
12 mA
0.8 V
"
7Q
"
"
"
"
16
"
"
0.8 V
12 mA
"
8Q
"
"
VI C
17
-18 mA
"
"
-1.5
"
OC
18
-18 mA
"
"
1D
"
"
19
-18 mA
"
"
2D
"
"
20
-18 mA
"
"
3D
"
"
21
-18 mA
"
"
4D
"
"
22
"
-18 mA
"
CLK
"
"
23
"
-18 mA
"
5D
"
"
24
"
-18 mA
"
6D
"
"
25
"
-18 mA
"
7D
"
"
26
"
-18 mA
"
8D
"
"
A
IIL
3009
27
0.4 V
"
5.5 V
2/
2/
OC
"
28
0.4 V
"
"
1D
"
"
"
29
0.4 V
"
"
2D
"
"
"
30
0.4 V
"
"
3D
"
"
"
31
0.4 V
"
"
4D
"
"
"
32
"
0.4 V
"
CLK
"
"
"
33
"
0.4 V
"
5D
"
"
"
34
"
0.4 V
"
6D
"
"
"
35
"
0.4 V
"
7D
"
"
"
36
"
0.4 V
"
8D
"
"
A
IIH1
3010
37
2.7 V
"
"
20
OC
"
38
2.7 V
"
"
1D
"
"
"
39
2.7 V
"
"
2D
"
"
"
40
2.7 V
"
"
3D
"
"
"
41
2.7 V
"
"
4D
"
"
"
42
"
2.7 V
"
CLK
"
"
"
43
"
2.7 V
"
5D
"
"
"
44
"
2.7 V
"
6D
"
"
"
45
"
2.7 V
"
7D
"
"
"
46
"
2.7 V
"
8D
"
"
IIH2
"
47
7.0 V
"
"
100
"
OC
"
48
7.0 V
"
"
1D
"
"
"
49
7.0 V
"
"
2D
"
"
"
50
7.0 V
"
"
3D
"
"
"
51
7.0 V
"
"
4D
"
"
"
52
"
7.0 V
"
CLK
"
"
"
53
"
7.0 V
"
5D
"
"
"
54
"
7.0 V
"
6D
"
"
"
55
"
7.0 V
"
7D
"
"
"
56
"
7.0 V
"
8D
"
"
See footnotes at end of device type 04.
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