Microcircuits, Digital, Bipolar, Advanced Low-Power Schottky TTL, Binary Counters, Cascadable, Monolithic Silicon

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Microcircuits, Digital, Bipolar, Advanced Low-Power Schottky TTL, Binary Counters, Cascadable, Monolithic Silicon

Microcircuits, Digital, Bipolar, Advanced Low-Power Schottky TTL, Binary Counters, Cascadable, Monolithic Silicon
Recommended operating conditions
Specification and standard
Microcircuit group assignment
Table 1. Electrical performance characteristics
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Table 2. Electrical test requirements
Figure 1. Terminal connections (top view)
Figure 1. Terminal connections (top view) Device type 04
Figure 2. Logic diagrams
Figure 2. Logic diagrams Device type 02
Figure 2. Logic diagrams Device type 04
Figure 2. Logic diagrams Device type 05
Figure 3. Truth tables
Figure 3. Truth tables Device type 03
Figure 3. Truth tables Device type 04
Figure 3. Truth tables Device type 05
Figure 4. Typical operational sequence
Figure 4. Typical operational sequence Device type 03
Figure 4. Typical operational sequence Device type 04
Figure 4. Typical operational sequence Device type 05
Figure 5. Burn-in and life test circuit
Figure 5. Burn-in and life test circuit Device type 05
Figure 6. Switching time test circuit and waveforms for device types 01 and 02
Figure 6. Switching time test circuit and waveforms for device types 01 and 02-cont.
Figure 7. Switching time waveforms types 01 and 02
Figure 8. Switching time test circuit and waveforms for device type 03
Figure 8. Switching time test circuit and waveforms for device type 03 Clock to output
Figure 8. Switching time test circuit and waveforms for device type 03 Enable to RCO
Figure 9. Switching time test circuit and waveforms for device type 04
Figure 9. Switching time test circuit and waveforms for device type 04 Count up
Figure 9. Switching time test circuit and waveforms for device type 04 Asynchronous load
Figure 9. Switching time test circuit and waveforms for device type 04 Data to Q Outputs
Figure 9. Switching time test circuit and waveforms for device type 04 Enable T
Figure 9. Switching time test circuit and waveforms for device type 04 Asynchronous Clear
Figure 10. Switching time test circuit and waveforms for device type 05
Figure 10. Switching time test circuit and waveforms for device type 05 Count up
Figure 10. Switching time test circuit and waveforms for device type 05 ENP to CCO
Figure 10. Switching time test circuit and waveforms for device type 05 ACLR
Figure 10. Switching time test circuit and waveforms for device type 05 Tri-State Switching
Table 3. Group A Inspection for device type 01
Table 3. Group A Inspection for device type 01-cont.
Table 3. Group A Inspection for device type 01-cont.
Table 3. Group A Inspection for device type 02
Table 3. Group A Inspection for device type 02-cont.
Table 3. Group A Inspection for device type 02-cont.
Device types 01 and 02
Table 3. Group A Inspection for device type 03
Table 3. Group A Inspection for device type 03-cont.
Table 3. Group A Inspection for device type 03-cont.
Table 3. Group A Inspection for device type 03-cont.
Table 3. Group A Inspection for device type 04
Table 3. Group A Inspection for device type 04-cont.
Table 3. Group A Inspection for device type 04-cont.
Table 3. Group A Inspection for device type 04-cont.
Table 3. Group A Inspection for device type 04-cont.
Table 3. Group A Inspection for device type 04-cont.
Table 3. Group A Inspection for device type 05
Table 3. Group A Inspection for device type 05-cont.
Table 3. Group A Inspection for device type 05-cont.
Table 3. Group A Inspection for device type 05-cont.
Table 3. Group A Inspection for device type 05-cont.
Table 3. Group A Inspection for device type 05-cont.
Ordering data
Logistic support
Custodians

Microcircuits, Digital, Bipolar, Advanced Low-Power Schottky TTL, Binary Counters, Cascadable, Monolithic Silicon

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