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TABLE III. Group A inspection for device type 02.
Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open).
MIL-STD- Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
Subgroup Symbol
883
R, S, 2
Measured
Test limits
Unit
method Test no.
1D
2D
3D
4D
5D
6D
7D
8D
GND
ENC
VCC
terminal
Min
Max
8Q
7Q
6Q
5Q
4Q
3Q
2Q
1Q
OC
1
II H2
3010
47
7.0 V
GND
5.5 V
100
A
OC
Tc = 25
"
48
7.0 V
"
"
1D
"
"
C
"
49
7.0 V
"
"
2D
"
"
"
50
7.0 V
"
"
3D
"
"
"
51
7.0 V
"
"
4D
"
"
"
52
7.0 V
"
"
5D
"
"
"
53
7.0 V
"
"
6D
"
"
"
54
7.0 V
"
"
7D
"
"
"
55
7.0 V
"
"
8D
"
"
"
56
"
7.0 V
"
ENC
"
"
IO 2/
3011
57
GND
GND
"
5.0 V
2.25 V
"
-15 3/
-70 3/
mA
1Q
"
58
"
GND
"
"
2.25 V
"
"
"
2Q
"
59
"
GND
"
"
2.25 V
"
"
"
3Q
"
60
"
GND
"
"
2.25 V
"
"
"
4Q
"
61
"
GND
"
"
2.25 V
"
"
"
5Q
"
62
"
GND
"
"
2.25 V
"
"
"
6Q
"
63
"
GND
"
"
2.25 V
"
"
"
7Q
"
64
"
GND
"
"
2.25 V
"
"
"
8Q
IOZH
65
5.0 V
0.8 V
"
"
2.7 V
"
20
A
1Q
66
"
0.8 V
"
"
2.7 V
"
"
"
2Q
67
"
0.8 V
"
"
2.7 V
"
"
"
3Q
68
"
0.8 V
"
"
2.7 V
"
"
"
4Q
69
"
0.8 V
"
"
2.7 V
"
"
"
5Q
"
70
"
0.8 V
"
2.7 V
"
"
"
6Q
"
71
"
0.8 V
"
2.7 V
"
"
"
7Q
"
72
"
0.8 V
"
2.7 V
"
"
"
8Q
"
IOZL
73
"
2.0 V
"
0.4 V
"
-20
"
1Q
"
74
"
2.0 V
"
0.4 V
"
"
"
2Q
75
"
2.0 V
"
"
0.4 V
"
"
"
3Q
"
76
"
2.0 V
"
0.4 V
"
"
"
4Q
77
"
2.0 V
"
"
0.4 V
"
"
"
5Q
78
"
2.0 V
"
"
0.4 V
"
"
"
6Q
79
"
2.0 V
"
"
0.4 V
"
"
"
7Q
80
"
2.0 V
"
"
0.4 V
"
"
"
8Q
ICCH
3005
81
GND
GND  GND  GND
GND  GND
GND
GND  GND
"
"
"
VCC
17
mA
ICCL
"
82
GND
5.0 V  5.0 V  5.0 V  5.0 V  5.0 V
5.0 V
5.0 V  5.0 V
"
"
"
"
24
"
ICCZ
"
83
5.0 V  5.0 V  5.0 V  5.0 V  5.0 V  5.0 V
5.0 V
5.0 V  5.0 V
"
"
"
"
27
"
Same tests, terminal conditions, and limits as for subgroup 1, except TC = +125and VIC tests are omitted.
2
C
Same tests, terminal conditions, and limits as for subgroup 1, except TC = -55and VIC tests are omitted.
3
C
See footnotes at end of device type 02.

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