Microcircuits, Digital, Low Power Schottky TTL, Bus Transceivers, Monolithic Silicon

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Microcircuits, Digital, Low Power Schottky TTL, Bus Transceivers, Monolithic Silicon

Microcircuits, Digital, Low Power Schottky TTL, Bus Transceivers, Monolithic Silicon
Detail specification
Sampling and inspection
Quality conformance inspection
Table 1. Electrical performance characteristics
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Table 2. Electrical test requirements
Figure 1. Terminal connections
Figure 2. Truth table
Figure 2. Truth table Device types 03, 06
Figure 3. Logic diagram
Figure 3. Logic diagram Device type 03, 06
Figure 4. Schematic circuits
Figure 4. Schematic circuits BUS I/O port type 04, 05, and 06
Figure 5. Burn-in and life test circuit
Figure 5. Burn-in and life test circuit Devie types 02, 05
Figure 5. Burn-in and life test circuit Devie types 03, 06
Figure 6. Switching waveforms
Figure 6. Switching waveforms Device type 02, 05
Figure 6. Switching waveforms Device type 03, 06
Figure 6. Switching waveforms Waveforms A type 01, 02, only
Figure 6. Switching waveforms Waveforms A device type 03 only
Figure 6. Switching waveforms Waveforms A type 04, 05, only
Figure 6. Switching waveforms Waveforms A type 06 only
Figure 6. Switching waveforms Waveforms C
Figure 6. Switching waveforms Waveforms D
Table 3. Group A Inspection for device types 01 and 04
Table 3. Group A Inspection for device types 01 and 04-cont.
Table 3. Group A Inspection for device types 01 and 04-cont.
Table 3. Group A Inspection for device types 01 and 04-cont.
Table 3. Group A Inspection for device types 01 and 04-cont.
Table 3. Group A Inspection for device types 01 and 04-cont.
Table 3. Group A Inspection for device types 01 and 04-cont.
Table 3. Group A Inspection for device types 01 and 04-cont.
Table 3. Group A Inspection for device types 01 and 04-cont.
Table 3. Group A Inspection for device types 01 and 04-cont.
Table 3. Group A Inspection for device types 01 and 04-cont.
Table 3. Group A Inspection for device types 01 and 04-cont.
Table 3. Group A Inspection for device types 01 and 04-cont.
Table 3. Group A Inspection for device types 01 and 04-cont.
Table 3. Group A Inspection for device types 02 and 05
Table 3. Group A Inspection for device types 02 and 05-cont.
Table 3. Group A Inspection for device types 02 and 05-cont.
Table 3. Group A Inspection for device types 02 and 05-cont.
Table 3. Group A Inspection for device types 02 and 05-cont.
Table 3. Group A Inspection for device types 02 and 05-cont.
Table 3. Group A Inspection for device types 02 and 05-cont.
Table 3. Group A Inspection for device types 02 and 05-cont.
Table 3. Group A Inspection for device types 02 and 05-cont.
Table 3. Group A Inspection for device types 02 and 05-cont.
Table 3. Group A Inspection for device types 02 and 05-cont.
Table 3. Group A Inspection for device types 02 and 05-cont.
Table 3. Group A Inspection for device types 03 and 06
Table 3. Group A Inspection for device types 03 and 06-cont.
Table 3. Group A Inspection for device types 03 and 06-cont.
Table 3. Group A Inspection for device types 03 and 06-cont.
Table 3. Group A Inspection for device types 03 and 06-cont.
Table 3. Group A Inspection for device types 03 and 06-cont.
Table 3. Group A Inspection for device types 03 and 06-cont.
Table 3. Group A Inspection for device types 03 and 06-cont.
Table 3. Group A Inspection for device types 03 and 06-cont.
Table 3. Group A Inspection for device types 03 and 06-cont.
Table 3. Group A Inspection for device types 03 and 06-cont.
Table 3. Group A Inspection for device types 03 and 06-cont.
Table 3. Group A Inspection for device types 03 and 06-cont.
Table 3. Group A Inspection for device types 03 and 06-cont.
Generic test data
Standardization Document Improvement Proposal
Instructions

Microcircuits, Digital, Low Power Schottky TTL, Bus Transceivers, Monolithic Silicon

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