Microcircuits, Digital, CMOS, Buffer/Converter, True/Complement Buffer, Monolithic Silicon

Click here to make tpub.com your Home Page

Page Title: Microcircuits, Digital, CMOS, Buffer/Converter, True/Complement Buffer, Monolithic Silicon

Click here for thousands of PDF manuals

Web
www.tpub.com

Information Categories

....

Administration
Advancement
Aerographer
Automotive
Aviation
Construction
Diving
Draftsman
Engineering
Electronics
Food and Cooking
Logistics
Math
Medical
Music
Nuclear Fundamentals
Photography
Religion

Microcircuits, Digital, CMOS, Buffer/Converter, True/Complement Buffer, Monolithic Silicon

Microcircuits, Digital, CMOS, Buffer/Converter, True/Complement Buffer, Monolithic Silicon
Absolute maximum ratings
Schematic circuits
Correctness of indexing and marking
Table 1. Electrical performance characteristics
Table 1. Electrical performance characteristics-cont.
Table 1. Electrical performance characteristics-cont.
Table 2. Burn-in and electrical test requirements for device classification
Qualification extension
Figure 1. Logic diagrams and terminal connections
Figure 2. Truth tables and logic equations
Figure 3. Static burn-in test circuits
Figure 4. Dynamic burn-in and steady-state life test circuit
Figure 5. Switching time test circuit and waveforms
Table 3. Group A inspection for device types 01 and 03
Table 3. Group A inspection for device types 01 and 03-cont.
Table 3. Group A inspection for device types 01 and 03-cont.
Table 3. Group A inspection for device types 02 and 04
Table 3. Group A inspection for device types 02 and 04-cont.
Table 3. Group A inspection for device types 02 and 04-cont.
Table 3. Group A inspection for device types 05
Table 3. Group A inspection for device types 05-cont.
Table 3. Group A inspection for device types 05-cont.
Table 3. Group A inspection for device types 05-cont.
Table 3. Group A inspection for device types 51 and 53
Table 3. Group A inspection for device types 51 and 53-cont.
Table 3. Group A inspection for device types 51 and 53-cont.
Table 3. Group A inspection for device types 51 and 53-cont.
Table 3. Group A inspection for device types 52 and 54
Table 3. Group A inspection for device types 52 and 54-cont.
Table 3. Group A inspection for device types 52 and 54-cont.
Table 3. Group A inspection for device types 52 and 54-cont.
Table 3. Group A inspection for device type 55
Table 3. Group A inspection for device type 55-cont.
Table 3. Group A inspection for device type 55-cont.
Table 3. Group A inspection for device type 55-cont.
Table 4. Delta limits at 25C
Burn-in and life test cool down procedures
Table 7. Bias during exposure to radiation
Figure 7. Threshold-voltage test circuit
Table 8. Threshold voltage test circuit conditions
Logistic support
Handling
Standardization Document Improvement Proposal
Instructions

Microcircuits, Digital, CMOS, Buffer/Converter, True/Complement Buffer, Monolithic Silicon

Privacy Statement - Press Release - Copyright Information. - Contact Us

Integrated Publishing, Inc. - A (SDVOSB) Service Disabled Veteran Owned Small Business